ELECTRICAL CHARACTERISTICS – ADC
V(OUT) * 1.2
500 kW
www.ti.com .............................................................................................................................................................. SLVS663B – MAY 2006 – REVISED APRIL 2008
Over recommended operating conditions (typical values at TJ = 25°C), V(ADC_REF) =2.535v if external reference voltage is
used,application circuit as in
Figure 3 (unless otherwise noted).
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ANALOG INPUTS
Full scale input range Ch1 to
V(ADC
VRNG(CH1_5)
Positive inputs (active clamp), full scale ~ 2.535 V
0
V
Ch5
_REF)
Full scale input range Ch6 to
VINTREF
VRNG(CH6_8)
Positive inputs (active clamp), full scale ~4.7 V
0
V
Ch8
× 1.854
Input capacitance (all
CIN(ADC)
15
pF
channels)
RINADC(CH1_5)
Input resistance
(Ch1 to Ch5)
1
M
ILKGADC(CH1_5)
Leakage current
(Ch1 to Ch5)
100
nA
RINADC(CH6_8)
Input resistance
(Ch6 to Ch8)
430
540
k
ILKGADC(CH6_8)
Leakage current
(Ch6 to Ch8)
10
A
TJ = 25°C, ADC channel 5 input voltage
1.895
V
Internal voltage proportional to
VCH5(ADC)
junction temperature
Temperature coefficient
6.5
mV/
° C
DC ACCURACY
RES(ADC)
Resolution
SAR ADC
10
Bits
MCD(ADC)
No missing codes
SPECIFIED
INL(ADC)
Integral linearity error
±3
LSB
DNL(ADC)
Differential non-linearity error
±1
LSB
Difference between the first code transition
OFFZERO(ADC)
Offset error
5
LSB
(00...00 to 00...01) from the ideal AGND + 1 LSB
Offset error match between
OFFCH(ADC)
5
LSB
channels
Deviation in code from the ideal full scale code
GAINADC
Gain error
±8
LSB
(11…111) for the full scale voltage
GAINCH(ADC)
Gain error match
Any two channels
2
LSB
THROUGHPUT SPEED
ADCCLK
Sampling clock
600
750
900
kHz
Sampling, convertion and setting Rs
≤ 200 K for
ADCTCONV
Conversion time
44
59
68
s
CH1, CH2, CH3; Rs
≤ 500 for CH6, CH7, CH8
REFERENCE VOLTAGES
TA = 25°C, V(ADC_REF) = VINTREF when internal
VINTREF
Internal ADC reference voltage
2.53
2.535
2.54
V
ADC reference is selected
Internal reference short-circuit
V(ADC_REF) = AGND1, internal reference
ISHRT(INTREF)
6
mA
limit
enabled via I2C
ADC internal reference
VREF(DRIFT)
50
100 ppm/
°C
temperature drift
ADC Internal reference
Measured at OUT pin (internal reference) or
IQ(ADC)
40
A
quiescent current
ADC_REF pin (external reference)
00
0
ADC channel 2 bias current, set via
01
10
I2C register ADC_WAIT bits
A
ANLG2 pin internal pullup
I(ANLG2)
10
50
(ADC_CH2I_D1_1, ADC_CH2I _D2)
current source
11
60
Total accuracy, relative to selected value
–25%
25%
00
A
ADC channel 1 bias current, set via
01
10
I2C register ADC_WAIT bits
ANLG1 pin internal pullup
I(ANLG1)
(BATIDI_D1, BATIDI _D2)
current source
10
50
11
60
Total accuracy
10%
Copyright 2006–2008, Texas Instruments Incorporated
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