參數(shù)資料
型號(hào): TLV2352MU
廠商: Texas Instruments, Inc.
元件分類: 比較器
英文描述: LinCMOSE DUAL LOW-VOLTAGE DIFFERENTIAL COMPARATORS
中文描述: LinCMOSE雙低電壓差分比較器
文件頁數(shù): 13/21頁
文件大小: 311K
代理商: TLV2352MU
TLV2352, TLV2352Y
LinCMOS
DUAL LOW-VOLTAGE DIFFERENTIAL COMPARATORS
SLCS011B – MAY 1992 – REVISED MARCH 1999
13
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
Propagation delay time is defined as the interval between the application of an input step function and the instant when
the output crosses V
O
= 1 V with V
DD
= 3 V or when the output crosses V
O
= 1.4 V with V
DD
= 5 V. Propagation delay
time, low-to-high-level output, is measured from the leading edge of the input pulse while propagation delay time,
high-to-low-level output, is measured from the trailing edge of the input pulse. Propagation-delay-time measurement
at low input signal levels can be greatly affected by the input offset voltage. The offset voltage should be balanced
by the adjustment at the inverting input (as shown in Figure 11) so that the circuit is just at the transition point. Then
a low signal, for example 105-mV or 5-mV overdrive, causes the output to change states.
+
DUT
VDD
CL
(see Note A)
Pulse
Generator
10
10 Turn
1 V
– 1 V
1 k
50
1
μ
F
0.1
μ
F
TEST CIRCUIT
100 mV
Input
Overdrive
tPLH
100 mV
Input
Overdrive
90%
10%
tf
tPHL
Low-to-High
Level Output
High-to-Low
Level Output
VOLTAGE WAVEFORMS
5.1 k
Input Offset Voltage
Compensation
Adjustment
90%
10%
tr
VO = 1 V With VDD = 3 V
or
VO = 1.4 V With VDD = 5 V
NOTE A: CL includes probe and jig capacitance.
Figure 11. Propagation Delay, Rise, and Fall Times Test Circuit and Voltage Waveforms
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