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參數(shù)資料
| 型號： | SCAN18374T |
| 廠商： | Fairchild Semiconductor Corporation |
| 英文描述： | D-Type Flip-Flop with 3-STATE Outputs |
| 中文描述： | D類觸發(fā)器觸發(fā)器3態(tài)輸出 |
| 文件頁數(shù)： | 4/12頁 |
| 文件大?。?/td> | 99K |
| 代理商： | SCAN18374T |
www.fairchildsemi.com
4
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Description of Boundary-Scan Circuitry
The scan cells used in the BOUNDARY-SCAN register are
one of the following two types depending upon their loca-
tion. Scan cell TYPE1 is intended to solely observe system
data, while TYPE2 has the additional ability to control sys-
tem data.
Scan cell TYPE1 is located on each system input pin while
scan cell TYPE2 is located at each system output pin as
well as at each of the two internal active-high output enable
signals. AOE controls the activity of the A-outputs while
BOE controls the activity of the B-outputs. Each will acti-
vate their respective outputs by loading a logic high.
The BYPASS register is a single bit shift register stage
identical to scan cell TYPE1. It captures a fixed logic low.
Bypass Register Scan Chain Definition
Logic 0
The INSTRUCTION register is an eight-bit register which
captures the value 00111101.
The two least significant bits of this captured value (01) are
required by IEEE Std 1149.1. The upper six bits are unique
to the SCAN18374T device. SCAN CMOS Test Access
Logic devices do not include the IEEE 1149.1 optional
identification register. Therefore, this unique captured
value can be used as a
“
pseudo ID
”
code to confirm that
the correct device is placed in the appropriate location in
the boundary scan chain.
Instruction Register Scan Chain Definition
MSB
→
LSB
Scan Cell TYPE1
Scan Cell TYPE2
Instruction Code
00000000
10000001
10000010
00000011
All Others
Instruction
EXTEST
SAMPLE/PRELOAD
CLAMP
HIGHZ
BYPASS
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SCAN18374TSSC | D-Type Flip-Flop with 3-STATE Outputs |
| SCAN18540TSSC | Inverting Line Driver with 3-STATE Outputs |
| SCAN18541T | Non-Inverting Line Driver with 3-STATE Outputs |
| SCAN18541TSSC | Non-Inverting Line Driver with 3-STATE Outputs |
| SCANPSC100F | Embedded Boundary Scan Controller (IEEE 1149.1 Support) |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SCAN18374TFMQB WAF | 制造商:Texas Instruments 功能描述: |
| SCAN18374TSSC | 功能描述:觸發(fā)器 D-Type Flip-Flop RoHS:否 制造商:Texas Instruments 電路數(shù)量:2 邏輯系列:SN74 邏輯類型:D-Type Flip-Flop 極性:Inverting, Non-Inverting 輸入類型:CMOS 輸出類型: 傳播延遲時間:4.4 ns 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:X2SON-8 封裝:Reel |
| SCAN18374TSSCX | 功能描述:觸發(fā)器 D-Type Flip-Flop RoHS:否 制造商:Texas Instruments 電路數(shù)量:2 邏輯系列:SN74 邏輯類型:D-Type Flip-Flop 極性:Inverting, Non-Inverting 輸入類型:CMOS 輸出類型: 傳播延遲時間:4.4 ns 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:X2SON-8 封裝:Reel |
| SCAN1837TSSC | 制造商:FAIRCHILD 制造商全稱:Fairchild Semiconductor 功能描述:Transparent Latch with 3-STATE Outputs |
| SCAN18540_YDB3026B WAF | 制造商:Fairchild Semiconductor Corporation 功能描述: |
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