參數(shù)資料
型號(hào): PAC7126
廠商: 飛思卡爾半導(dǎo)體(中國(guó))有限公司
英文描述: Microcontroller Family Hardware Specifications
中文描述: 微控制器系列硬件規(guī)格
文件頁(yè)數(shù): 35/56頁(yè)
文件大?。?/td> 471K
代理商: PAC7126
Electrical Characteristics
MAC7100 Microcontroller Family Hardware Specifications, Rev. 1.2
Preliminary
Freescale Semiconductor
35
3.13.8 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures. The failure rates for data retention and program/erase
cycling are specified at the operating conditions noted. The program/erase cycle count on the sector is
incremented every time a sector or mass erase event is executed.
NOTE
All values shown in
Table 36
are target values and subject to
characterization. For Flash cycling performance, each program operation
must be preceded by an erase.
Table 36. NVM Reliability Characteristics
Conditions shown in
Table 7
unless otherwise noted.
Num
C
Rating
Min
Unit
X11
C Program/Data Flash Program/Erase endurance (–40C to +125C)
10,000
Cycles
X12
C Program/Data Flash Data Retention Lifetime
15
Years
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