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參數(shù)資料
| 型號(hào)： | PA28F004S5-120 |
| 廠商： | INTEL CORP |
| 元件分類(lèi)： | PROM |
| 英文描述： | BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| 中文描述： | 512K X 8 FLASH 5V PROM, 120 ns, PDSO44 |
| 封裝： | 13.30 X 28.20 MM, PLASTIC, SOP-44 |
| 文件頁(yè)數(shù)： | 27/37頁(yè) |
| 文件大小： | 611K |
| 代理商： | PA28F004S5-120 |
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E
6.2.2
BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY
27
PRODUCT PREVIEW
AC INPUT/OUTPUT TEST CONDITIONS
TEST POINTS
INPUT
OUTPUT
1.5
3.0
0.0
1.5
AC test inputs are driven at 3.0V for a Logic "1" and 0.0V for a Logic "0." Input timing begins, and output timing ends, at 1.5V.
Input rise and fall times (10% to 90%) <10 ns.
Figure 12. Transient Input/Output Reference Waveform for V
CC
= 5.0V ± 5%
(High Speed Testing Configuration)
TEST POINTS
INPUT
OUTPUT
2.0
0.8
0.8
2.0
2.4
0.45
AC test inputs are driven at V
(2.4 V
) for a Logic "1" and V
(0.45 V
) for a Logic "0." Input timing begins at V
IH
(2.0 V
TTL
) and V
IL
(0.8 V
TTL
). Output timing ends at V
IH
and V
IL
. Input rise and fall times (10% to 90%) <10 ns.
Figure 13. Transient Input/Output Reference Waveform for V
CC
= 5.0V
±
10%
(Standard Testing Configuration)
DEVICE
UNDER
TEST
1.3V
1N914
R
L
C
L
OUT
= 3.3 K
NOTE:
C
L
includes Jig Capacitance
Figure 14. Transient Equivalent Testing
Load Circuit
Test Configuration Capacitance Loading Value
Test Configuration
C
L
(pF)
V
CC
= 5.0V
±
5%
30
V
CC
= 5.0V
±
10%
100
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| PA28F004S5-85 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
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| PA28F008S3-150 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SMART 3 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
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