參數資料
| 型號： | P87C51SBPN,112 |
| 廠商： | NXP Semiconductors |
| 文件頁數： | 16/38頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC 80C51 MCU 4K OTP 40-DIP |
| 產品培訓模塊： | Migrating from 8/16-Bit MCUs to 32-Bit ARMs |
| 標準包裝： | 9 |
| 系列： | 87C |
| 核心處理器： | 8051 |
| 芯體尺寸： | 8-位 |
| 速度： | 16MHz |
| 連通性： | EBI/EMI，UART/USART |
| 外圍設備： | POR |
| 輸入/輸出數： | 32 |
| 程序存儲器容量： | 4KB（4K x 8） |
| 程序存儲器類型： | OTP |
| RAM 容量： | 128 x 8 |
| 電壓 - 電源 (Vcc/Vdd)： | 2.7 V ~ 5.5 V |
| 振蕩器型： | 內部 |
| 工作溫度： | 0°C ~ 70°C |
| 封裝/外殼： | 40-DIP（0.600"，15.24mm） |
| 包裝： | 管件 |
| 產品目錄頁面： | 705 (CN2011-ZH PDF) |
| 其它名稱： | 568-1011-5 935260176112 P87C51SBPN |
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Philips Semiconductors
Product specification
80C51/87C51/80C52/87C52
80C51 8-bit microcontroller family
4 K/8 K OTP/ROM low voltage (2.7 V–5.5 V),
low power, high speed (33 MHz), 128/256 B RAM
2000 Aug 07
23
DC ELECTRICAL CHARACTERISTICS
Tamb = 0°C to +70°C or –40°C to +85°C, 33 MHz devices; 5 V ±10%; VSS = 0 V
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP1
MAX
UNIT
VIL
Input low voltage11
4.5 V < VCC < 5.5 V
–0.5
0.2 VCC–0.1
V
VIH
Input high voltage (ports 0, 1, 2, 3, EA)
0.2 VCC+0.9
VCC+0.5
V
VIH1
Input high voltage, XTAL1, RST11
0.7 VCC
VCC+0.5
V
VOL
Output low voltage, ports 1, 2, 3 8
VCC = 4.5 V
IOL = 1.6mA2
0.4
V
VOL1
Output low voltage, port 0, ALE, PSEN 7, 8
VCC = 4.5 V
IOL = 3.2mA2
0.4
V
VOH
Output high voltage, ports 1, 2, 3 3
VCC = 4.5 V
IOH = –30A
VCC – 0.7
V
VOH1
Output high voltage (port 0 in external bus
mode), ALE9, PSEN3
VCC = 4.5 V
IOH = –3.2mA
VCC – 0.7
V
IIL
Logical 0 input current, ports 1, 2, 3
VIN = 0.4 V
–1
–50
A
ITL
Logical 1-to-0 transition current, ports 1, 2, 36
VIN = 2.0 V
See note 4
–650
A
ILI
Input leakage current, port 0
0.45 < VIN < VCC – 0.3
±10
A
ICC
Power supply current (see Figure 21):
See note 5
Active mode (see Note 5)
Idle mode (see Note 5)
Power-down mode or clock stopped (see Fig-
25 f
diti
)
Tamb = 0°C to 70°C
3
50
A
ure 25 for conditions)
Tamb = –40°C to +85°C
75
A
RRST
Internal reset pull-down resistor
40
225
k
CIO
Pin capacitance10 (except EA)
15
pF
NOTES:
1. Typical ratings are not guaranteed. The values listed are at room temperature, 5 V.
2. Capacitive loading on ports 0 and 2 may cause spurious noise to be superimposed on the VOLs of ALE and ports 1 and 3. The noise is due
to external bus capacitance discharging into the port 0 and port 2 pins when these pins make 1-to-0 transitions during bus operations. In the
worst cases (capacitive loading > 100 pF), the noise pulse on the ALE pin may exceed 0.8 V. In such cases, it may be desirable to qualify
ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input. IOL can exceed these conditions provided that no
single output sinks more than 5mA and no more than two outputs exceed the test conditions.
3. Capacitive loading on ports 0 and 2 may cause the VOH on ALE and PSEN to momentarily fall below the VCC–0.7 specification when the
address bits are stabilizing.
4. Pins of ports 1, 2 and 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches its
maximum value when VIN is approximately 2 V.
5. See Figures 22 through 25 for ICC test conditions.
Active mode:
ICC(MAX) = 0.9 × FREQ. + 1.1 mA
Idle mode:
ICC(MAX) = 0.18 × FREQ. +1.0 mA; See Figure 21.
6. This value applies to Tamb = 0°C to +70°C. For Tamb = –40°C to +85°C, ITL = –750 A.
7. Load capacitance for port 0, ALE, and PSEN = 100 pF, load capacitance for all other outputs = 80 pF.
8. Under steady state (non-transient) conditions, IOL must be externally limited as follows:
Maximum IOL per port pin:
15 mA (*NOTE: This is 85
°C specification.)
Maximum IOL per 8-bit port:
26 mA
Maximum total IOL for all outputs:
71 mA
If IOL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current greater than the listed
test conditions.
9. ALE is tested to VOH1, except when ALE is off then VOH is the voltage specification.
10. Pin capacitance is characterized but not tested. Pin capacitance is less than 25 pF. Pin capacitance of ceramic package is less than 15 pF
(except EA is 25 pF).
11. To improve noise rejection a nominal 100 ns glitch rejection circuitry has been added to the RST pin, and a nominal 15 ns glitch rejection
circuitry has been added to the INT0 and INT1 pins. Previous devices provided only an inherent 5 ns of glitch rejection.
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