參數(shù)資料
型號： MSP430F5437IPNR
廠商： TEXAS INSTRUMENTS INC
元件分類： 微控制器/微處理器
英文描述： 16-BIT, FLASH, 25 MHz, RISC MICROCONTROLLER, PQFP80
封裝： GREEN, PLASTIC, LQFP-80
文件頁數(shù)： 37/99頁
文件大?。?/td> 985K
代理商： MSP430F5437IPNR
MSP430F543x, MSP430F541x
SLAS612C – AUGUST 2009 – REVISED MARCH 2010
www.ti.com
Schmitt-Trigger Inputs – General Purpose I/O
(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
MIN
TYP
MAX
UNIT
1.8 V
0.80
1.40
VIT+
Positive-going input threshold voltage
V
3 V
1.50
2.10
1.8 V
0.45
1.00
VIT–
Negative-going input threshold voltage
V
3 V
0.75
1.65
1.8 V
0.3
0.8
Vhys
Input voltage hysteresis (VIT+ – VIT–)
V
3 V
0.4
1.0
For pullup: VIN = VSS
RPull
Pullup/pulldown resistor
20
35
50
k
For pulldown: VIN = VCC
CI
Input capacitance
VIN = VSS or VCC
5
pF
(1)
Same parametrics apply to clock input pin when crystal bypass mode is used on XT1 (XIN) or XT2 (XT2IN).
Inputs – Ports P1 and P2
(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
MIN
MAX
UNIT
Port P1, P2: P1.x to P2.x, External trigger pulse width to
t(int)
External interrupt timing(2)
2.2 V/3 V
20
ns
set interrupt flag
(1)
Some devices may contain additional ports with interrupts. See the block diagram and terminal function descriptions.
(2)
An external signal sets the interrupt flag every time the minimum interrupt pulse width t(int) is met. It may be set by trigger signals shorter
than t(int).
Leakage Current – General Purpose I/O
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
MIN
MAX
UNIT
Ilkg(Px.x)
High-impedance leakage current
(1) (2)
1.8 V/3 V
±50
nA
(1)
The leakage current is measured with VSS or VCC applied to the corresponding pin(s), unless otherwise noted.
(2)
The leakage of the digital port pins is measured individually. The port pin is selected for input and the pullup/pulldown resistor is
disabled.
42
Copyright 2009–2010, Texas Instruments Incorporated
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