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參數(shù)資料
| 型號(hào)： | MNDM54LS502-X |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | 8 - BIT SUCCESSIVE APPROXIMATION REGISTER |
| 中文描述： | 8 -位逐次逼近寄存器 |
| 文件頁(yè)數(shù)： | 6/6頁(yè) |
| 文件大?。?/td> | 14K |
| 代理商： | MNDM54LS502-X |
MICROCIRCUIT DATA SHEET
MNDM54LS502-X REV 1A0
Revision History
Rev
1A0
ECN #
M0002904 08/24/98
Rel Date
Originator
Linda Collins
Changes
Initial MDS release:MNDM54LS502-X Rev. 1A0. Changed
note 5 (Guaranteed, not tested) in the AC 50pF notes
reference column to note 2 (Screen tested 100% at
+25C, subgroup 9) & to note 4 (Sample tested at +25C,
subgroup 9. Subgroups 10 & 11 are guaranteed, not
tested). Changed note 2 in the AC 15pF notes reference
column to note 5. Reworded the phrase in note 4 from
'and periodically at +125C & -55C, subgroups 10 & 11'
to 'Subgroups 10 & 11 are guaranteed, not tested'.
6
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