參數(shù)資料
型號: MNDM54LS502-X
廠商: National Semiconductor Corporation
英文描述: 8 - BIT SUCCESSIVE APPROXIMATION REGISTER
中文描述: 8 -位逐次逼近寄存器
文件頁數(shù): 5/6頁
文件大?。?/td> 14K
代理商: MNDM54LS502-X
MNDM54LS502-X REV 1A0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC PARAMETER - 50pF
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC:
CL=50pF, RL=2K ohms Temp range: -55C to +125C
SYMBOL
PARAMETER
CONDITIONS
NOTES
PIN-
NAME
MIN
MAX
UNIT
SUB-
GROUPS
tpLH
Propagation Delay
VCC=5.0V
2, 4 CP to
Qn or
CC
2.0
40.0
ns
9
2, 4 CP to
Qn or
CC
2.0
52.0
ns
10, 11
tpHL
Propagation Delay
VCC=5.0V
2, 4 CP to
Qn or
CC
2.0
30.0
ns
9
2, 4 CP to
Qn or
CC
2.0
39.0
ns
10, 11
ts (H/L)
Setup Time
VCC=5.0V
2, 4 S to CP 5.0
ns
9
2, 4 S to CP 10.0
ns
10, 11
th (H/L)
Hold Time
VCC=5.0V
2, 4 S to CP 5.0
ns
9
2, 4 S to CP 10.0
ns
10, 11
ts (H/L) 2
SetupTime
VCC=5.0V
2, 4 D to CP 5.0
ns
9
2, 4 D to CP 10.0
ns
10, 11
th (H/L) 2
Hold Time
VCC=5.0V
2, 4 D to CP 5.0
ns
9
2, 4 D to CP 10.0
ns
10, 11
tw (H/L)
Pulse Width
VCC=5.0V
2, 4 CP
20.0
ns
9
2, 4 CP
25.0
ns
10, 11
fMAX
Clock Frequency
VCC=5.5V
2, 4 CP
25.0
MHZ
9
2, 4 CP
20.0
MHZ
10, 11
Note 1:
Screen tested 100% on each device at -55C, +25C & +125C temperature, subgroups A1, 2,
3, 7 & 8.
Screen tested 100% on each device at +25C temperature only, subgroup A9.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C & -55C
temperature, subgroups A1, 2, 3, 7 & 8.
Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, subgroup A9.
Subgroups 10 & 11 are guaranteed, not tested.
Guaranteed, not tested.
Note 2:
Note 3:
Note 4:
Note 5:
5
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