
1-398
NC
No Connection
This pin is not connected to circuitry within the device.
→
NC
No Connection
This pin is not connected to circuitry within the device.
PRA
Probe A
The Probe A pin is used for FPGA diagnostics. Function
is controlled by the MODE pin.
→
I/O
This pin is used as an I/O only. It is not used for diagnos-
tic probe or device programming functions on an MPGA.
PRB
Probe B
The Probe B pin is used for FPGA diagnostics. Function
is controlled by the MODE pin.
→
I/O
This pin is used as an I/O only. It is not used for diagnos-
tic probe or device programming functions on an MPGA.
QCLKA/B,C,D
Quadrant Clock (Input/Output)
(3200DX only)
These four pins are the quadrant clock inputs. When not
used as a register control signal, these pins can function
as general purpose I/O.
→ No Change
If desired, TTL Clock input signals may be moved to any
MPGA location.
SDI
Serial Data Input
Serial data input for diagnostic probe and device pro-
gramming. Function is controlled by the MODE pin.
→ I/O
This pin is used as an I/O only. It is not used for diagnos-
tic probe or device programming functions on an MPGA.
TCK
Test Clock (3200DX only)
Clock signal to shift the JTAG data into the device. This
pin functions as an I/O when the JTAG fuse is not pro-
grammed
→ No Change
TDI
Test Data In (3200DX only)
Serial data input or JTAG instructions and data. Data is
shifted in on the rising edge of TCLK. This pin functions
as an I/O when the JTAG fuse is not programmed.
→ No Change
TDO
Test Data Out (3200DX only)
Serial data output for JTAG instructions and test data.
This pin functions as an I/O when the JTAG fuse is not
programmed.
→ No Change
TMS
Test Mode Select (3200DX only)
Serial data input for JTAG test mode. Data is shifted in on
the rising edge of TCLK. This pin functions as an I/O
when the JTAG fuse is not programmed.
→ No Change
VCC
Supply Voltage
HIGH supply voltage.
→
VCC
HIGH supply voltage.
Table 1 FPGA-to-MPGA Pin Cross-Reference (continued)
FPGA Pin Description
MPGA Pin Description