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參數(shù)資料
| 型號(hào)： | LPC11E14FHN33/401, |
| 廠商： | NXP Semiconductors |
| 文件頁(yè)數(shù)： | 4/8頁(yè) |
| 文件大?。?/td> | 0K |
| 描述： | IC MCU 32BIT 32K 32HVQFN |
| 產(chǎn)品培訓(xùn)模塊： | Code Density for LPC11xx |
| 標(biāo)準(zhǔn)包裝： | 260 |
| 系列： | LPC11Exx |
| 核心處理器： | ARM? Cortex?-M0 |
| 芯體尺寸： | 32-位 |
| 速度： | 50MHz |
| 連通性： | I²C，Microwire，SPI，SSI，SSP，UART/USART |
| 外圍設(shè)備： | 欠壓檢測(cè)/復(fù)位，POR，WDT |
| 輸入/輸出數(shù)： | 28 |
| 程序存儲(chǔ)器容量： | 32KB（32K x 8） |
| 程序存儲(chǔ)器類型： | 閃存 |
| EEPROM 大?。?/td> | 4K x 8 |
| RAM 容量： | 10K x 8 |
| 電壓 - 電源 (Vcc/Vdd)： | 1.8 V ~ 3.6 V |
| 數(shù)據(jù)轉(zhuǎn)換器： | A/D 8x10b |
| 振蕩器型： | 內(nèi)部 |
| 工作溫度： | -40°C ~ 85°C |
| 封裝/外殼： | 32-VQFN 裸露焊盤 |
| 包裝： | 托盤 |
| 其它名稱： | 568-8583 |
ES_LPC11E1X
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2013. All rights reserved.
Errata sheet
Rev. 2 — 1 February 2013
4 of 8
NXP Semiconductors
ES_LPC11E1x
Errata sheet LPC11E1x
3.
Functional problems detail
3.1 ADC.1: A/D Global Data register should not be used with burst mode
or hardware triggering
Introduction:
On the LPC11E1x, the START field and the BURST bit in the A/D control register specify
whether A/D conversions are initiated via software command, in response to some
hardware trigger, or continuously in burst ("hardware-scan") mode. Results of the ADC
conversions can be read in one of two ways. One is to use the A/D Global Data Register
to read all data from the ADC. Another is to use the individual A/D Channel Data
Registers.
Problem:
If the burst mode is enabled (BURST bit set to ‘1’) or if hardware triggering is specified,
the A/D conversion results read from the A/D Global Data register could be incorrect. If
conversions are only launched directly by software command (BURST bit = '0' and START
= ‘001’), the results read from the A/D Global Data register will be correct provided the
previous result is read prior to launching a new conversion.
Work-around:
When using either burst mode or hardware triggering, the individual A/D Channel Data
registers should be used instead of the A/D Global Data register to read the A/D
conversion results.
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