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IRHNA9064, IRHNA93064 Devices
Pre-Irradiation
8
www.irf.com
(
Total Dose Irradiation with VGS Bias.
-12 volt VGS applied and VDS = 0 during
irradiation per MIL-STD-750, method 1019, condition A.
)
Total Dose Irradiation with VDS Bias.
VDS = 0.8 rated BVDSS (pre-irradiation)
applied and VGS = 0 during irradiation per
MlL-STD -750, method 1019, condition A.
'
This test is performed using a flash x-ray
source operated in the e-beam mode (energy
~2.5 MeV), 30 nsec pulse.
*
All Pre-Irradiation and Post-Irradiation test
conditions are
identical
to facilitate direct
comparison for circuit applications.
"
Repetitive Rating; Pulse width limited by
maximum junction temperature.
Refer to current HEXFET reliability report.
#
@ VDD = -25V, Starting TJ = 25
°
C,
EAS = [0.5 * L * (IL
2
)]
Peak IL = -48A, VGS = -12V, 25
≤
RG
≤
200
$
ISD
≤
-48A, di/dt
≤
150A/
μ
s,
VDD
≤
BVDSS, TJ
≤
150
°
C
Suggested RG = 2.35
%
Pulse width
≤
300
μ
s; Duty Cycle
≤
2%
Case Outline and Dimensions — SMD-2
SMD-2
WORLD HEADQUARTERS:
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IR SOUTHEAST ASIA:
1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 221 8371
IR TAIWAN:
16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673, Taiwan Tel: 886-2-2377-9936
http://www.irf.com/ Data and specifications subject to change without notice 8/98