參數(shù)資料
型號(hào): IXST35N120B
廠商: IXYS CORP
元件分類: IGBT 晶體管
英文描述: IGBT
中文描述: 70 A, 1200 V, N-CHANNEL IGBT, TO-268AA
封裝: D3PAK-3
文件頁數(shù): 2/2頁
文件大小: 82K
代理商: IXST35N120B
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETS and IGBTs are covered by one or more of the following U.S. patents:
4,835,592
4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,486,715
5,381,025
6,306,728B1
Symbol
Test Conditions
Characteristic Values
(T
J
= 25
°
C, unless otherwise specified)
min.
typ.
max.
g
fs
I
C
Note 2
= I
C90
; V
CE
= 10 V,
16
23
S
C
ies
C
oes
C
res
3600
pF
V
CE
= 25 V, V
GE
= 0 V, f = 1 MHz
260
pF
75
pF
Q
g
Q
ge
Q
gc
120
nC
I
C
= I
C90
, V
GE
= 15 V, V
CE
= 0.5 V
CES
33
nC
49
nC
t
d(on)
t
ri
t
d(off)
t
fi
E
off
36
ns
27
ns
160
180
300
300
ns
ns
5
9
mJ
t
d(on)
t
ri
E
on
t
d(off)
t
fi
E
off
38
ns
29
ns
2.5
mJ
240
340
ns
ns
9
mJ
R
thJC
R
thCK
0.42 K/W
(TO-247)
0.25
K/W
Inductive load, T
J
= 125
°
C
I
C
= I
C90
, V
GE
= 15 V
R
G
= 5
,
V
CE
= 0.8 V
CES
Note 3
TO-247 AD Outline (IXSH)
Inductive load, T
J
= 25
°
C
I
C
= I
C90
, V
GE
= 15 V
R
G
= 5
V
CE
= 0.8 V
CES
Note 3
Notes:1.
Device must be heatsunk for high temperature leakage current
measurements to avoid thermal runaway.
2.
Pulse test, t
300
μ
s, duty cycle
2 %
3.
Switching times may increase for V
CE
(Clamp) > 0.8 V
CES
, higher T
J
or
increased R
G
.
1 = Gate
2 = Collector
3 = Emitter
Tab = Collector
TO-268 Outline (IXST)
IXSH 35N120B
IXST 35N120B
Dim.
Millimeter
Min.
4.9
2.7
.02
1.15
1.9
.4
13.80
15.85
13.3
e 5.45 BSC .215 BSC
H
18.70
19.10
L
2.40
2.70
L1
1.20
1.40
Inches
Min.
.193
.106
.001
.045
.75
.016
.543
.624
.524
Max.
5.1
2.9
.25
1.45
2.1
.65
14.00
16.05
13.6
Max.
.201
.114
.010
.057
.83
.026
.551
.632
.535
A
A
1
A
2
b
b
2
C
D
E
E
1
.736
.094
.047
.752
.106
.055
L2
L3 0.25 BSC .010 BSC
L4
3.80
4.10
1.00
1.15
.039
.045
.150
.161
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