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參數(shù)資料
| 型號： | ISPLSI81080V-125LB492 |
| 廠商： | LATTICE SEMICONDUCTOR CORP |
| 元件分類： | PLD |
| 英文描述： | 3.3V In-System Programmable SuperBIG⑩ High Density PLD |
| 中文描述： | EE PLD, 14.5 ns, PBGA492 |
| 封裝： | BGA-492 |
| 文件頁數(shù)： | 20/26頁 |
| 文件大?。?/td> | 333K |
| 代理商： | ISPLSI81080V-125LB492 |
Specifications
ispLSI 81080V
20
CLK0, CLK1,
CLK2
CLKEN
Dedicated clock input for the GLB registers only. These clock inputs are connected to one of the clock
inputs of all GLB registers in the device.
Dedicated clock enable input for the GLB registers only. This input is available as a clock enable for
each GLB register in the device. Use of the clock enable input eliminates the need for the user to gate
the clock to the register.
Ground (GND)
Global Output Enable inputs.
GND
GOE0, GOE1,
GOE2, GOE3
SET/RESET
Dedicated reset/preset pin connected to ALL registers in the device, GLB registers and I/O registers.
Each register can independently choose to be reset or preset when this signal goes active. The active
polarity is user-selectable.
Dedicated clock enable input for the I/O registers only. This input is available as a clock enable input for
all I/O registers in the device. Use of the clock enable input eliminates the need for the user to tie the
clock to the I/O register.
Input/Output
–
These are the general purpose I/O used by the logic array.
Embedded Port Enable Pin
–
When this pin is high, the port is enabled. When this pin is low, the
state machine is held at reset asynchronously and TCK, TMS and TDI are ignored.
Input
–
This signal is the Test Mode Select input signal.
Dedicated clock inputs for the I/O registers only. These clock inputs are connected to the I/O registers
on the same side of the device only, they are not connected to all of the I/O registers. Use of these
quadrant I/O clocks gives the fastest tco from the device.
IOCLKEN
I/O
EPEN
TMS
QIOCLK0,
QIOCLK1,
QIOCLK2,
QIOCLK3
TCK
TDI
TDO
TOE
VCC
VCCIO
Input
–
This signal is the Test Clock input signal.
Input
–
This signal is the Test Data input signal.
Output
–
This signal is the Test Data Out Output Signal.
Test Output Enable. Tristates all I/O pins when a logic low is driven.
Vcc
Power supply for the output drivers. The internal logic of the device is connected to VCC which is
always 3.3V. The output drivers are connected to VCCIO which can be equal to VCC or 2.5V. This
allows the output drivers to be powered from 2.5V, for example, to interface directly with another 2.5V
device.
No connect.
1. NC pins are not to be connected to any active signals, VCC or GND.
NC
1
Signal Descriptions
Signal Name Description
相關PDF資料 |
PDF描述 |
|---|---|
| ISPLSI81080V-90LB492 | 3.3V In-System Programmable SuperBIG⑩ High Density PLD |
| ISPLSI8600V-125LB272 | 3.3V In-System Programmable SuperBIG⑩ High Density PLD |
| ISPLSI8600V-125LB492 | 3.3V In-System Programmable SuperBIG⑩ High Density PLD |
| ISPLSI8600V-60LB272 | 3.3V In-System Programmable SuperBIG⑩ High Density PLD |
| ISPLSI8600V-60LB492 | 3.3V In-System Programmable SuperBIG⑩ High Density PLD |
相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| ISPLSI81080V-60LB272 | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| ISPLSI81080V-60LB272I | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| ISPLSI81080V-60LB492 | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Lattice Semiconductor Corporation 功能描述: |
| ISPLSI81080V-90LB272 | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| ISPLSI81080V-90LB492 | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
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