參數(shù)資料
型號: IRG4ZC71KD
文件頁數(shù): 9/10頁
文件大小: 224K
代理商: IRG4ZC71KD
IRG4ZC71KD
www.irf.com
9
Vg
GATE SIGNAL
DEVICE UNDER TEST
CURRENT D.U.T.
VOLTAGE IN D.U.T.
CURRENT IN D1
t0
t1
t2
D.U.T.
V *
50V
L
1000V
6000μF
100V
Figure 19. Clamped Inductive Load Test Circuit
Figure 20. Pulsed Collector Current
Test Circuit
R
L
=
480V
4 X I
C
@25°C
0 - 480V
Figure 18e. Macro Waveforms for
Figure 18a's
Test Circuit
Notes:
Repetitive rating: V
GE
=20V; pulse width limited by maximum junction
temperature (figure 20)
V
CC
=80%(V
CES
), V
GE
=20V, L=10μH, R
G
= 5.0
(figure 19)
Pulse width
80μs; duty factor
0.1%
Pulse width 5.0μs, single shot
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