參數(shù)資料
型號: IRFD1Z1
廠商: HARRIS SEMICONDUCTOR
元件分類: 小信號晶體管
英文描述: 0.4A and 0.5A, 60V and 100V, 2.4 and 3.2 Ohm, N-Channel Power MOSFETs
中文描述: 500 mA, 60 V, N-CHANNEL, Si, SMALL SIGNAL, MOSFET
文件頁數(shù): 3/6頁
文件大小: 57K
代理商: IRFD1Z1
5-3
Internal Drain Inductance
L
D
Measured From The
Drain Lead, 2mm
(0.08in) From Package
to Center of Die
Modified MOSFET
Symbol Showing the
Internal Devices
Inductances
-
4.0
-
nH
Internal Source Inductance
L
S
Measured From The
Source Lead, 2mm
(0.08in) From Header to
Source Bonding Pad
-
6.0
-
nH
Thermal Resistance Junction to Ambient
R
θ
JA
Free Air Operation
-
-
120
o
C/W
Source to Drain Diode Specifications
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNITS
Continuous Source to Drain Current
IRFD1Z0, IRFD1Z1
I
SD
Modified MOSFET
Symbol Showing the
Integral Reverse
P-N Junction Diode
-
-
0.5
A
IRFD1Z2, IRFD1Z3
-
-
0.4
A
Pulse Source to Drain Current
IRFD1Z0, IRFD1Z1
I
SDM
-
-
4.0
A
IRFD1Z2, IRFD1Z3
-
-
3.2
A
Source to Drain Diode Voltage (Note 2)
IRFD1Z0, IRFD1Z1
V
SD
T
A
= 25
o
C, I
SD
= 0.5A, V
GS
= 0V
T
A
= 25
o
C, I
SD
= 0.4A, V
GS
= 0V
T
J
= 150
o
C, I
SD
= 0.5A, dI
SD
/dt = 100A/
μ
s
T
J
= 150
o
C, I
SD
= 0.5A, dI
SD
/dt = 100A/
μ
s
-
-
1.4
V
IRFD1Z2, IRFD1Z3
-
-
1.3
V
Reverse Recovery Time
t
rr
-
100
-
ns
Reverse Recovery Charge
Q
RR
-
0.2
-
μ
C
NOTES:
2. Pulse test: pulse width
300
μ
s, duty cycle
2%.
3. Repetitive rating: pulse width limited by maximum junction temperature.
Typical Performance Curves
Unless Otherwise Specified
FIGURE 1. NORMALIZED POWER DISSIPATION vs
AMBIENT TEMPERATURE
FIGURE 2. MAXIMUM CONTINUOUS DRAIN CURRENT vs
AMBIENT TEMPERATURE
Electrical Specifications
T
C
= 25
o
C, Unless Otherwise Specified
(Continued)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
TYP
MAX
UNITS
L
S
L
D
G
D
S
G
D
S
T
A
, AMBIENT TEMPERATURE (
o
C)
P
0.0
0
25
50
75
100
150
0.2
0.4
0.6
0.8
1.0
1.2
125
T
A
, AMBIENT TEMPERATURE (
o
C)
50
75
100
25
150
0.4
0.2
0
0.1
I
D
D
125
0.3
IRFD1Z0, IRFD1Z1
IRFD1Z2, IRFD1Z3
0.5
IRFD1Z0, IRFD1Z1, IRFD1Z2, IRFD1Z3
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