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參數(shù)資料
| 型號： | ID82C87H-5 |
| 廠商： | INTERSIL CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | CMOS Octal Inverting Bus Transceiver |
| 中文描述： | CMOS SERIES, 8-BIT TRANSCEIVER, INVERTED OUTPUT, CDIP20 |
| 封裝： | CERAMIC, DIP-20 |
| 文件頁數(shù)： | 4/8頁 |
| 文件大?。?/td> | 94K |
| 代理商： | ID82C87H-5 |
4-328
Absolute Maximum Ratings
Thermal Information
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .+8.0V
Input, Output or I/O Voltage . . . . . . . . . . . .GND -0.5V to V
CC
+0.5V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Operating Conditions
Operating Voltage Range . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Range
C82C87H . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0
o
C to +70
o
C
I82C87H . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -40
o
C to +85
o
C
M82C87H . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55
o
C to +125
o
C
Thermal Resistance (Typical)
CERDIP Package . . . . . . . . . . . . . . . .
CLCC Package . . . . . . . . . . . . . . . . . .
PDIP Package . . . . . . . . . . . . . . . . . . .
PLCC Package . . . . . . . . . . . . . . . . . .
Storage Temperature Range. . . . . . . . . . . . . . . . . .-65
o
C to +150
o
C
Maximum Junction Temperature Hermetic Package. . . . . . . +175
o
C
Maximum Junction Temperature Plastic Package. . . . . . . . . +150
o
C
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . +300
o
C
(PLCC - Lead Tips Only)
θ
JA
(
o
C/W)
70
80
75
75
θ
JC
(
o
C/W)
16
20
N/A
N/A
Die Characteristics
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .265 Gates
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
DC Electrical Specifications
V
CC
= 5.0V
±
10%; T
A
= 0
o
C to +70
o
C (C82C87H);
T
A
= -40
o
C to +85
o
C (I82C87H);
T
A
= -55
o
C to +125
o
C (M82C87H)
SYMBOL
PARAMETER
MIN
MAX
UNITS
TEST CONDITIONS
V
IH
Logical One
2.0
-
V
C82C87H, I82C87H
Input Voltage
2.2
-
V
M82C87H (Note 1)
V
IL
Logical Zero Input Voltage
-
0.8
V
V
OH
Logical One Output Voltage
B Outputs
3.0
-
V
I
OH
= -8mA
A Outputs
3.0
-
V
I
OH
= -4mA
A or B Outputs
V
CC
-0.4
-
V
I
OH
= -100
μ
A
V
OL
Logical Zero Output Voltage
B Outputs
-
0.45
V
I
OL
= 20mA
A Outputs
-
0.45
V
I
OL
= 12mA
I
I
Input Leakage Current
-10.0
10.0
μ
A
V
IN
= GND or V
CC
DIP Pins 9, 11
IO
Output Leakage Current
-10.0
10.0
μ
A
VO = GND or V
CC
, OE
≥
V
CC
-0.5V
DIP Pins 1 - 8, 12 - 19
ICCSB
Standby Power Supply
Current
-
10
μ
A
V
IN
= V
CC
or GND, V
CC
= 5.5V, Outputs Open
ICCOP
Operating Power Supply
Current
-
1
mA/MHz
T
A
= +25
o
C, Typical (See Note 2)
NOTES:
1. V
IH
is measured by applying a pulse of magnitude = V
IH(MIN)
to one data input at a time and checking the corresponding device output for
a valid logical “1” during valid input high time. Control pins (T, OE) are tested separately with all device data input pins at V
CC
-0.4.
2. Typical ICCOP = 1mA/MHz of read/ cycle time. (Example: 1.0
μ
s read/write cycle time = 1mA).
Capacitance
T
A
= +25
o
C
SYMBOL
PARAMETER
TYPICAL
UNITS
TEST CONDITIONS
CIN
Input Capacitance
B Inputs
18
pF
Freq = 1MHz, all measurements are
referenced to device GND
A Inputs
14
pF
82C87H
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