Pin Name
I/O
ROM Code
Option
Description
PC2~PC3
I/O
Wake-up
Pull-high
or None
Bidirectional 2-bit input/output port. Each bit can be configured
as a wake-up input by ROM code option. Software* instructions
determine the CMOS output or schmitt trigger input with or with-
out pull-high resistor.
PC4~PC7
I/O
Pull-high
or None
Bidirectional 4-bit input/output port. Software* instructions de-
terminetheCMOSoutputorschmitttriggerinputwithorwithout
pull-high resistor.
PD0~PD7
I/O
Pull-high
or None
Bidirectional 8-bit input/output port. Software* instructions de-
terminetheCMOSoutputorschmitttriggerinputwithorwithout
pull-high resistor.
PE0~PE1
I/O
Pull-high
or None
Bidirectional input/output port. Software* instructions determine
the CMOS output or schmitt trigger input with or without
pull-high resistor.
PE2~PE4
O
This pin is an NMOS output structure. The pad can function as
LED drivers for the keyboard. I
OL
=14mA, @V
OL
=3.2V
VDD
Positive power supply
VSS
Negative power supply, ground
RESET
I
Chip reset input. Active low. Built-in power-on reset circuit to re-
set the entire chip. Chip can also be externally reset via RESET
pin
OSC1
OSC2
I
O
Crystal or
RC
OSC1, OSC2 are connected to an RC network or a crystal for the
internal system clock. In the case of RC operation, OSC2 is the
output terminal for the 1/4 system clock; A 110k
nected to OSC1 to generate a 2MHZ frequency.
resistor is con-
Note:
*: Software means the ROM code option can be configured by HT-IDE (Holtek Integrated De-
velopment Environment).
Absolute Maximum Ratings
Supply Voltage ............................. 0.3V to 5.5V
Storage Temperature ................ 50 C to 125 C
Input Voltage ................V
SS
0
.
3V to V
DD
+0.3V
Operating Temperature ............. 25 C to 70 C
Note: These are stress ratings only. Stresses exceeding the range specified under Absolute Maxi-
mumRatings maycausesubstantialdamagetothedevice.Functionaloperationofthisdevice
at other conditions beyond those listed in the specification is not implied and prolonged expo-
sure to extreme conditions may affect device reliability.
HT82K68E
4
August 8, 2000
Preliminary