參數(shù)資料
型號(hào): HI5628IN
廠商: HARRIS SEMICONDUCTOR
元件分類: DAC
英文描述: Power Resistor; Series:200; Resistance:1ohm; Resistance Tolerance:+/- 5%; Power Rating:8W; Resistor Element Material:Ceramic; Temperature Coefficient:+/-400 ppm; Leaded Process Compatible:Yes; Packaging:Bulk RoHS Compliant: Yes
中文描述: DUAL, PARALLEL, 8 BITS INPUT LOADING, 0.015 us SETTLING TIME, 8-BIT DAC, PQFP48
文件頁數(shù): 4/10頁
文件大?。?/td> 93K
代理商: HI5628IN
4
Absolute Maximum Ratings
Thermal Information
Digital Supply Voltage DV
DD
to DCOM . . . . . . . . . . . . . . . . . +5.5V
Analog Supply Voltage AV
DD
to ACOM. . . . . . . . . . . . . . . . . +5.5V
Grounds, ACOM TO DCOM . . . . . . . . . . . . . . . . . . . -0.3V to +0.3V
Digital Input Voltages (D7-D0, CLK, SLEEP). . . . . . . . DV
DD
+ 0.3V
Internal Reference Output Current. . . . . . . . . . . . . . . . . . . . .
±
50
μ
A
Reference Input Voltage Range. . . . . . . . . . . . . . . . . . AV
DD
+ 0.3V
Analog Output Current (I
OUT
) . . . . . . . . . . . . . . . . . . . . . . . . . 24mA
Operating Conditions
Temperature Range. . . . . . . . . . . . . . . . . . . . . . . . . . -40
o
C to 85
o
C
Thermal Resistance (Typical, Note 1)
LQFP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . .150
o
C
Maximum Storage Temperature Range. . . . . . . . . . -65
o
C to 150
o
C
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300
o
C
θ
JA
(
o
C/W)
75
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1.
θ
JA
is measured with the component mounted on an evaluation PC board in free air.
Electrical Specifications
AV
DD
= +5V, DV
DD
= +5V, V
REF
= Internal 1.2V, IOUTFS = 20mA, T
A
= 25
o
C for All Typical Values. Data given
is per channel except for ‘Power Supply Characteristics.’
PARAMETER
TEST CONDITIONS
HI5628IN
T
A
= -40
o
C TO 85
o
C
MIN
TYP
UNITS
MAX
SYSTEM PERFORMANCE
(Per Channel)
Resolution
Integral Linearity Error, INL
Differential Linearity Error, DNL
Offset Error, I
OS
Offset Drift Coefficient
8
-
-
Bits
LSB
LSB
% FSR
“Best Fit” Straight Line (Note 7)
(Note 7)
(Note 7)
(Note 7)
-0.5
-0.5
±
0.25
±
0.25
-
0.1
+0.5
+0.5
-0.025
+0.025
-
-
ppm
FSR/
o
C
% FSR
% FSR
Full Scale Gain Error, FSE
With External Reference (Notes 2, 7)
With Internal Reference (Notes 2, 7)
With External Reference (Note 7)
-10
-10
-
±
2
±
1
±
50
+10
+10
-
Full Scale Gain Drifta
ppm
FSR/
o
C
With Internal Reference (Note 7)
-
±
100
-
ppm
FSR/
o
C
dB
dB
V
mA
Gain Matching Between Channels
I/Q Channel Isolation
Output Voltage Compliance Range
Full Scale Output Current, I
FS
DYNAMIC CHARACTERISTICS
(Per Channel)
Clock Rate, f
CLK
Output Settling Time, (t
SETT
)
-0.5
-
-0.3
2
0.1
80
-
-
0.5
-
1.25
20
F
OUT
= 10MHz
(Note 3)
(Note 3, 9)
0.8% (
±
1 LSB, equivalent to 7 Bits) (Note 7)
0.4% (
±
1/2 LSB, equivalent to 8 Bits) (Note 7)
R
L
= 25
(Note 7)
Full Scale Step
Full Scale Step
125
-
-
-
-
-
-
-
-
-
5
-
-
-
-
-
-
-
-
-
MHz
ns
ns
pVs
ns
ns
pF
15
5
1.5
1.5
10
50
30
Singlet Glitch Area (Peak Glitch)
Output Rise Time
Output Fall Time
Output Capacitance
Output Noise
IOUTFS = 20mA
IOUTFS = 2mA
pA/
Hz
pA/
Hz
HI5628
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