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參數(shù)資料
| 型號(hào)： | HCTS132D |
| 廠商： | Intersil Corporation |
| 英文描述： | Quadruple 2-Input Positive-NAND Gate 14-CDIP -55 to 125 |
| 中文描述： | 輻射加固四2輸入與非施密特觸發(fā)器 |
| 文件頁數(shù)： | 4/9頁 |
| 文件大小： | 123K |
| 代理商： | HCTS132D |
503
Specifications HCTS132MS
Output Voltage Low
VOL
VCC = 4.5V and 5.5V, VIH = VCC/2,
VIL = 0.4V, IOL = 50
μ
A
+25
o
C
-
0.1
V
Output Voltage High
VOH
VCC = 4.5V and 5.5V, VIH = VCC/2,
VIL = 0.4V, IOH = -50
μ
A
+25
o
C
VCC
-0.1
-
V
Input Leakage Current
IIN
VCC = 5.5V, VIN = VCC or GND
+25
o
C
-
±
5
μ
A
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 2.25V,
VIL = 0.4V, (Note 3)
+25
o
C
-
-
-
Input to Output
TPLH
VCC = 4.5V
+25
o
C
2
25
ns
TPHL
VCC = 4.5V
+25
o
C
2
25
ns
Input Switch Points
Vt+
VCC = 4.5
+25
o
C
0.40
2.25
ns
Vt-
VCC = 4.5
+25
o
C
0.40
2.25
ns
VH
VCC = 4.5
+25
o
C
0.10
1.40
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500
, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = 3V.
3. For functional tests, VO
≥
4.0V is recognized as a logic “1”, and VO
≤
0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
o
C)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
3
μ
A
IOL/IOH
5
-15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE: 1. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER
SYMBOL
(NOTES 1, 2)
CONDITIONS
TEMPERATURE
200K RAD
LIMITS
UNITS
MIN
MAX
Spec Number
518604
相關(guān)PDF資料 |
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|---|---|
| HCTS132DMSR | Quadruple 2-Input Positive-NAND Gate 14-CFP -55 to 125 |
| HCTS132K | Hex Inverters 20-LCCC -55 to 125 |
| HCTS132KMSR | Hex Inverters 14-CDIP -55 to 125 |
| HCTS132MS | Radiation Hardened Quad 2-Input NAND Schmitt Trigger |
| HCTS138KMSR | TVS 300W 6V SOT23 |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HCTS132DMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input NAND Schmitt Trigger |
| HCTS132HMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input NAND Schmitt Trigger |
| HCTS132K | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input NAND Schmitt Trigger |
| HCTS132KMSR | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input NAND Schmitt Trigger |
| HCTS132MS | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened Quad 2-Input NAND Schmitt Trigger |
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