
8088
ABSOLUTE MAXIMUM RATINGS
*
Ambient Temperature Under Bias àààà0
§
C to
a
70
§
C
Case Temperature (Plastic) ààààààààà0
§
C to
a
95
§
C
Case Temperature (CERDIP) àààààààà0
§
C to
a
75
§
C
Storage Temperature àààààààààà
b
65
§
C to
a
150
§
C
Voltage on Any Pin with
Respect to Groundààààààààààààààà
b
1.0 to
a
7V
Power Dissipationààààààààààààààààààààààà2.5 Watt
NOTICE: This is a production data sheet. The specifi-
cations are subject to change without notice.
*
WARNING: Stressing the device beyond the ‘‘Absolute
Maximum Ratings’’ may cause permanent damage.
These are stress ratings only. Operation beyond the
‘‘Operating Conditions’’ is not recommended and ex-
tended exposure beyond the ‘‘Operating Conditions’’
may affect device reliability.
D.C. CHARACTERISTICS
(T
A
e
0
§
C to 70
§
C, T
CASE
(Plastic)
e
0
§
C to 95
§
C, T
CASE
(CERDIP)
e
0
§
C to 75
§
C,
T
A
e
0
§
C to 55
§
C and T
CASE
e
0
§
C to 75
§
C for P8088-2 only
T
A
is guaranteed as long as T
CASE
is not exceeded)
(V
CC
e
5V
g
10% for 8088, V
CC
e
5V
g
5% for 8088-2 and Extended Temperature EXPRESS)
Symbol
Parameter
Min
Max
Units
Test Conditions
V
IL
Input Low Voltage
b
0.5
a
0.8
V
(Note 1)
V
IH
Input High Voltage
2.0
V
CC
a
0.5
V
(Notes 1, 2)
V
OL
Output Low Voltage
0.45
V
I
OL
e
2.0 mA
I
OH
e b
400
m
A
T
A
e
25
§
C
V
OH
Output High Voltage
2.4
V
I
CC
8088
340
350
250
mA
Power Supply Current: 8088-2
P8088
I
LI
Input Leakage Current
g
10
m
A
0V
s
V
IN
s
V
CC
(Note 3)
0.45V
s
V
OUT
s
V
CC
I
LO
Output and I/O Leakage Current
g
10
m
A
V
CL
Clock Input Low Voltage
b
0.5
a
0.6
V
V
CH
Clock Input High Voltage
3.9
V
CC
a
1.0
V
C
IN
Capacitance If Input Buffer
(All Input Except
AD
0
–AD
7
, RQ/GT)
15
pF
fc
e
1 MHz
C
IO
Capacitance of I/O Buffer
AD
0
–AD
7
, RQ/GT)
15
pF
fc
e
1 MHz
NOTES:
1. V
IL
tested with MN/MX Pin
e
0V
V
IH
tested with MN/MX Pin
e
5V
MN/MX Pin is a strap Pin
2. Not applicable to RQ/GT0 and RQ/GT1 Pins (Pins 30 and 31)
3. HOLD and HLDA I
LI
Min
e
30
m
A, Max
e
500
m
A
16