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ORDERING INFORMATION
BasicModelNumber:2WProduct
VoltageInput:
5VIn
VoltageOutput:
5VOut
DualOutput:
PackageCode:
P=DIP-14
U=SO-28
DCP02
05
(D) ()
ABSOLUTE MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
SBVS011K – MARCH 2000 – REVISED FEBRUARY 2008
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
For the most current package and ordering information, see the Package Option Addendum at the end of this
data sheet, or see the TI website at www.ti.com.
Supplemental Ordering Information
Over operating free-air temperature range (unless otherwise noted)
(1)
PARAMETER
DCP02 Series
UNIT
5V input models
7
V
12V input models
15
V
Input Voltage
15V input models
18
V
24V input models
29
V
Storage temperature range
–60 to +125
°C
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
At TA = +25°C, unless otherwise noted.
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
OUTPUT
Power
100% full load
2
W
Ripple
Output capacitor = 1
F, 50% load
20
mVPP
Room to cold
0.046
%/
°C
Voltage vs. Temperature
Room to hot
0.016
%/
°C
INPUT
Voltage range on VS
–10
10
%
ISOLATION
1s Flash test
1
kVrms
Voltage
60s test, UL1950(1)
1
kVrms
LINE REGULATION
VS (min) to VS (typ)
1
15
%
Output Voltage
IO = constant
(2)
VS (typ) to VS (max)
1
15
%
(1)
During UL1950 recognition tests only.
(2)
IOUT ≥ 10% load current
2
Copyright 2000–2008, Texas Instruments Incorporated