TA
參數(shù)資料
型號(hào)： CYW150OXCT
廠商： Silicon Laboratories Inc
文件頁數(shù)： 2/14頁
文件大小： 0K
描述： IC CLOCK 440BX AGP 56SSOP
標(biāo)準(zhǔn)包裝： 1,000
類型： 時(shí)鐘/頻率合成器，擴(kuò)展頻譜時(shí)鐘發(fā)生器
PLL： 是
主要目的： Intel CPU 服務(wù)器
輸入： 時(shí)鐘，晶體
輸出： 時(shí)鐘
電路數(shù)： 1
比率 - 輸入:輸出： 2:33
差分 - 輸入:輸出： 無/無
頻率 - 最大： 150MHz
電源電壓： 3.135 V ~ 3.465 V
工作溫度： 0°C ~ 70°C
安裝類型： 表面貼裝
封裝/外殼： 56-BSSOP（0.295"，7.50mm 寬）
供應(yīng)商設(shè)備封裝： 56-SSOP
包裝： 帶卷 (TR)
CYW150
...................... Document #: 38-07177 Rev. *B Page 10 of 14
AC Electrical Characteristics
TA = 0°C to +70°C; VDDQ3 = 3.3V±5%; VDDQ2 = 2.5V±5%; fXTL
= 14.31818 MHz. AC clock parameters are tested and
guaranteed over stated operating conditions using the stated
lump capacitive load at the clock output; Spread Spectrum
clocking is disabled.
Crystal Oscillator
VTH
X1 Input threshold Voltage[6]
VDDQ3 = 3.3V
1.65
V
CLOAD
Load Capacitance, Imposed on
External Crystal[7]
14
pF
CIN,X1
X1 Input Capacitance[8]
Pin X2 unconnected
28
pF
Pin Capacitance/Inductance
CIN
Input Pin Capacitance
Except X1 and X2
5
pF
COUT
Output Pin Capacitance
6pF
LIN
Input Pin Inductance
7nH
DC Electrical Characteristics (TA = 0°C to +70°C; VDDQ3 = 3.3V ±5%; VDDQ2 = 2.5V ±5%) (continued)
Parameter
Description
Test Condition
Min.
Typ.
Max.
Unit
CPU Clock Outputs, CPU_F, 1:2 (Lump Capacitance Test Load = 20 pF)
Parameter
Description
Test Condition/Comments
CPU = 66.8 MHz
CPU = 100 MHz
Unit
Min.
Typ.
Max.
Min.
Typ.
Max.
tP
Period
Measured on rising edge at 1.25
15
15.5
10
10.5
ns
tH
High Time
Duration of clock cycle above 2.0V
5.2
3.0
ns
tL
Low Time
Duration of clock cycle below 0.4V
5.0
2.8
ns
tR
Output Rise Edge Rate Measured from 0.4V to 2.0V
1
4
1
4
V/ns
tF
Output Fall Edge Rate
Measured from 2.0V to 0.4V
1
4
1
4
V/ns
tD
Duty Cycle
Measured on rising and falling edge at
1.25V
45
55
45
55
%
tJC
Jitter, Cycle-to-Cycle
Measured on rising edge at 1.25V.
Maximum difference of cycle time
between two adjacent cycles.
250
ps
tSK
Output Skew
Measured on rising edge at 1.25V
175
ps
fST
Frequency Stabilization
from Power-up (cold
start)
Assumes full supply voltage reached
within 1 ms from power-up. Short cycles
exist prior to frequency stabilization.
33
ms
Zo
AC Output Impedance
Average value during switching
transition. Used for determining series
termination value.
20
PCI Clock Outputs, PCI_F and PCI0:5 (Lump Capacitance Test Load = 30 pF)
Parameter
Description
Test Condition/Comments
CPU = 66.6/100 MHz
Unit
Min.
Typ.
Max.
tP
Period
Measured on rising edge at 1.5V
30
ns
tH
High Time
Duration of clock cycle above 2.4V
12.0
ns
tL
Low Time
Duration of clock cycle below 0.4V
12.0
ns
tR
Output Rise Edge Rate
Measured from 0.4V to 2.4V
1
4
V/ns
Notes:
6. X1 input threshold voltage (typical) is VDDQ3/2.
7. The CYW150 contains an internal crystal load capacitor between pin X1 and ground and another between pin X2 and ground. Total load placed on crystal is
14 pF; this includes typical stray capacitance of short PCB traces to crystal.
8. X1 input capacitance is applicable when driving X1 with an external clock source (X2 is left unconnected).
tF
Output Fall Edge Rate
Measured from 2.4V to 0.4V
1
4
V/ns
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