![](http://datasheet.mmic.net.cn/310000/AD9101AE_datasheet_16239544/AD9101AE_3.png)
NOT ES
1
If the analog input exceeds
±
300 mV, the clock levels should be shifted as shown in the T heory of Operation section entitled “Driving the Encode Clock.”
2
T ime to recover within rated error band from 160% overdrive.
3
Sampling bandwidth is defined as the –3 dB frequency response of the input sampler to the hold capacitor when operating in the sampling mode. It is greater than
tracking bandwidth because it does not include the bandwidth of the output amplifier.
4
Hold mode noise is proportional to the length of time a signal is held. For example, if the hold time (t
H
) is 20 ns, the accumulated noise is typically 3
μ
V
(150 mV/s
×
20 ns). T his value must be combined with the track mode noise to obtain total noise.
5
T otal energy of worst case track-to-hold or hold-to-track glitch.
Specifications subject to change without notice.
–3–
REV. 0
AD9101
20-Pin SOIC
RTN
RTN
C
B+
CLK
NC
V
IN
V
OUT
GND
CLK
GND
GND
1
2
3
4
5
6
7
8
9
10
20
19
18
17
16
15
14
13
12
11
TOP VIEW
(Not to Scale)
AD9101
+V
S
+V
S
+V
S
+V
S
C
B–
–V
S
–V
S
–V
S
–V
S
20-Contact Ceramic LCC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19 20
BOTTOM VIEW
R
R
GND
GND
+V
S
C
B
C
–V
S
–V
S
NC
V
IN
V
O
GND
C
C
B
+V
S
+V
S
–
S
–
S
+
S
PIN CONFIGURAT IONS
ABSOLUT E MAX IMUM RAT INGS
1
Supply Voltage (+V
S
) . . . . . . . . . . . . . . . . . . . . –0.5 V to +6 V
Supply Voltage (–V
S
) . . . . . . . . . . . . . . . . . . . . –6 V to +0.5 V
Analog Input Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . .
±
5 V
CLOCK /
CLOCK
Input . . . . . . . . . . . . . . . . . –5 V to +0.5 V
Continuous Output Current
4
. . . . . . . . . . . . . . . . . . . . 70 mA
Storage T emperature . . . . . . . . . . . . . . . . . . –65
°
C to +150
°
C
Operating T emperature Range
AE, AR . . . . . . . . . . . . . . . . . . . . . . . . . . . . –40
°
C to +85
°
C
SE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –55
°
C to +125
°
C
Junction T emperature (Ceramic)
2
. . . . . . . . . . . . . . . +175
°
C
Junction T emperature (Plastic)
2
. . . . . . . . . . . . . . . . +150
°
C
Soldering T emperature (1 minute)
3
. . . . . . . . . . . . . . +220
°
C
NOT ES
1
Absolute maximum ratings are limiting values to be applied individually, and
beyond which the serviceability of the circuit may be impaired. Functional
operability is not necessarily implied. Exposure to absolute maximum rating
conditions for an extended period of time may affect device reliability.
2
T ypical thermal impedances (no air flow, soldered to PC board) are as follows:
Ceramic LCC:
θ
JA
= 48
°
C/W;
θ
JC
= 9.9
°
C/W; Plastic SOIC:
θ
JA
= 54
°
C/W;
θ
= 7.3
°
C/W.
3
For surface mount devices, mounted by vapor phase soldering. Prior to vapor phase
soldering, plastic units should receive a minimum eight hour bakeout at 110
°
C to
drive off any moisture absorbed in plastic during shipping or storage. T hrough-hole
devices can be soldered at +300
°
C for 10 seconds.
4
Output is short circuit protected to ground. Continuous short circuit may affect
device reliability.
Pin Description
Pin
Description
Connection
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
RT N
RT N
C
B+
+V
S
+V
S
GND
GND
+V
S
+V
S
CLK
CLK
–V
S
–V
S
N/C
V
IN
GND
–V
S
–V
S
C
B–
V
OUT
Gain Set Resistor Return*
Gain Set Resistor Return*
Bootstrap Capacitor (Positive Bias)
+5 V Power Supply (Analog)
+5 V Power Supply (Analog)
Hold Capacitor Ground
Hold Capacitor Ground
+5 V Power Supply (Digital)
+5 V Power Supply (Digital)
T rue ECL T /H Clock
Complement ECL T /H Clock
–5.2 V Power Supply (Digital)
–5.2 V Power Supply (Digital)
No Connection
Analog Signal Input
Ground (Signal Return)
–5.2 V Power Supply (Analog)
–5.2 V Power Supply (Analog)
Bootstrap Capacitor (Negative Bias)
Analog Signal Output
*See “Matching the AD9101 to A/D Encoders.” Both pins should either be
grounded or connected to voltage source for offset.
WARNING!
ESD SENSITIVE DEVICE
C AUT ION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD9101 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. T herefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
E X PLANAT ION OF T E ST LE VE LS
T est Level
I
– 100% production tested.
II
– 100% production tested at +25
°
C, and sample tested at
specified temperatures.
III – Periodically sample tested.
IV – Parameter is guaranteed by design and characterization
testing.
V
– Parameter is a typical value only.
VI – All devices are 100% production tested at +25
°
C. 100%
production tested at temperature extremes for extended
temperature devices; sample tested at temperature
extremes for commercial/industrial devices.
ORDE RING INFORMAT ION
T emperature
Range
Package
Description
Package
Option
Model
AD9101AR
AD9101AE
AD9101SE
–40
°
C to +85
°
C
–40
°
C to +85
°
C
–55
°
C to +125
°
C
Plastic SOIC
LCC
LCC
R-20
E-20A
E-20A