參數(shù)資料
型號: AD7746ARUZ-REEL7
廠商: Analog Devices, Inc.
元件分類: 溫度/濕度傳感器
英文描述: 24-Bit Capacitance-to-Digital Converter with Temperature Sensor
中文描述: 24位的電容數(shù)字轉(zhuǎn)換器的溫度傳感器
文件頁數(shù): 4/28頁
文件大?。?/td> 391K
代理商: AD7746ARUZ-REEL7
AD7745/AD7746
Parameter
Full-Scale Drift vs. Temperature
Average VIN Input Current
Analog VIN Input Current Drift
Power Supply Rejection
Power Supply Rejection
Normal Mode Rejection
Common-Mode Rejection
INTERNAL VOLTAGE REFERENCE
Voltage
Drift vs. Temperature
EXTERNAL VOLTAGE REFERENCE INPUT
Differential REFIN Voltage
2
Absolute REFIN Voltage
2
Average REFIN Input Current
Average REFIN Input Current Drift
Common-Mode Rejection
SERIAL INTERFACE LOGIC INPUTS
(SCL, SDA)
V
IH
Input High Voltage
V
IL
Input Low Voltage
Hysteresis
Input Leakage Current (SCL)
OPEN-DRAIN OUTPUT (SDA)
V
OL
Output Low Voltage
I
OH
Output High Leakage Current
LOGIC OUTPUT (RDY)
V
OL
Output Low Voltage
V
OH
Output High Voltage
V
OL
Output Low Voltage
V
OH
Output High Voltage
POWER REQUIREMENTS
V
DD
-to-GND Voltage
I
DD
Current
I
DD
Current Power-Down Mode
Rev. 0 | Page 4 of 28
Min
1.169
0.1
GND 0.03
Typ
5
0.5
300
±50
80
90
75
50
95
1.17
5
2.5
400
±50
80
Max
1.171
V
DD
V
DD
+ 0.03
Unit
ppm of FS/°C
ppm of FS/°C
nA/V
pA/V/°C
dB
dB
dB
dB
dB
V
ppm/°C
V
V
nA/V
pA/V/°C
dB
Test Conditions/Comments
Internal reference
External reference
Internal reference, V
IN
= V
REF
/2
External reference, V
IN
= V
REF
/2
50 Hz ± 1%, conversion time = 122.1 ms
60 Hz ± 1%, conversion time = 122.1 ms
V
IN
= 1 V
T
A
= 25°C
2.1
4.0
V
DD
– 0.6
4.75
2.7
150
±0.1
0.1
750
700
0.5
0.8
±1
0.4
1
0.4
0.4
5.25
3.6
850
2
V
V
mV
μA
V
μA
V
V
V
V
V
V
μA
μA
μA
μA
I
SINK
=
6.0 mA
V
OUT
= V
DD
I
SINK
= 1.6 mA, V
DD
= 5 V
I
SOURCE
= 200 μA, V
DD
= 5 V
I
SINK
= 100 μA, V
DD
= 3 V
I
SOURCE
= 100 μA, V
DD
= 3 V
V
DD
= 5 V, nominal
V
DD
= 3.3 V, nominal
Digital inputs equal to V
DD
or GND
V
DD
= 5 V
V
DD
= 3.3 V
Digital inputs equal to V
DD
or GND
1
Capacitance units: 1 pF = 10
-12
F; 1 fF = 10
-15
F; 1 aF = 10
-18
F.
2
Specification is not production tested, but is supported by characterization data at initial product release.
3
Factory calibrated. The absolute error includes factory gain calibration error, integral nonlinearity error, and offset error after system offset calibration, all at 25°C. At
different temperatures, compensation for gain drift over temperature is required.
4
The capacitive input offset can be eliminated using a system offset calibration. The accuracy of the system offset calibration is limited by the offset calibration register
LSB size (32 aF) or by converter + system p-p noise during the system capacitive offset calibration, whichever is greater. To minimize the effect of the converter +
system noise, longer conversion times should be used for system capacitive offset calibration. The system capacitance offset calibration range is ±1 pF, the larger
offset can be removed using CAPDACs.
5
The gain error is factory calibrated at 25°C. At different temperatures, compensation for gain drift over temperature is required.
6
The CAPDAC resolution is seven bits in the actual CAPDAC full range. Using the on-chip offset calibration or adjusting the capacitive offset calibration register can
further reduce the CIN offset or the unchanging CIN component.
7
The VTCHOP bit in the VT SETUP register must be set to 1 for the specified temperature sensor and voltage input performance.
8
Using an external temperature sensing diode 2N3906, with nonideality factor n
f
= 1.008, connected as in Figure 41, with total serial resistance <100 .
9
Full-scale error applies to both positive and negative full scale.
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