參數(shù)資料
型號(hào): 73S1217F-68IMR/F/P
廠商: Maxim Integrated Products
文件頁(yè)數(shù): 9/93頁(yè)
文件大?。?/td> 0K
描述: IC SMART CARD READER PROG 68-QFN
產(chǎn)品培訓(xùn)模塊: Lead (SnPb) Finish for COTS
Obsolescence Mitigation Program
標(biāo)準(zhǔn)包裝: 2,500
系列: 73S12xx
核心處理器: 80515
芯體尺寸: 8-位
速度: 24MHz
連通性: I²C,智能卡,UART/USART,USB
外圍設(shè)備: LED,POR,WDT
輸入/輸出數(shù): 8
程序存儲(chǔ)器容量: 64KB(64K x 8)
程序存儲(chǔ)器類(lèi)型: 閃存
RAM 容量: 2K x 8
電壓 - 電源 (Vcc/Vdd): 2.7 V ~ 6.5 V
振蕩器型: 內(nèi)部
工作溫度: -40°C ~ 85°C
封裝/外殼: 68-VFQFN 裸露焊盤(pán)
包裝: 帶卷 (TR)
UG_12xxF_016
73S12xxF Software User Guide
Rev. 1.50
17
3
Testing Environment
Teridian performs conformance and certification testing to verify both the 73S12xxF IC (hardware and
electrical) and libraries (protocol, timing and application firmware and drivers). These tests are dictated
by specific standards. Each standard has a specific set of hardware and software configuration
requirements. This section describes the protocol portion of the testing that has been performed.
3.1
EMV Level I Compliant Testing
This section describes the EMV Level I compliant protocol testing. EMV Level I Electrical testing is
beyond the scope of this document.
Depending on the accredited test labs, EMV Level I compliant protocol testing can be done using either a
Visa or a MasterCard test suite under the Payment System Environment (PSE). Each test environment
has its own setup/configuration and selected tests for each setup.
For example, in the MasterCard test suite, there are a few configurable choices that must be considered.
Each answer to these six questions would require a different test setup and expected behavior of the
reader. The true/false answers shown after the questions below were selected for Teridian’s EMV Level I
compliant testing.
Terminal supports parameters negotiation technique: (true/false) - true
Terminal deactivates after I-Block with LEN = 0xFF: (true/false) - true
Terminal supports resynchronization: (true/false) - false
Terminal deactivates after BWT excess: (true/false) - true
Terminal deactivates after CWT excess: (true/false) - true
Terminal sends S(Abort Response): (true/false) – false
The EMV Level I Master Card test suite was performed by both an independent/accredited test lab and
by Teridian’s internal test lab. The testing was done using internal slot (slot #1) and all internal EMV
Level I tests passed.
EMV Level I formal compliant test at an accredited lab (Cetecom) is in progress.
3.2
CCID Testing
The 73S12xxF part provides two control interfaces to the host: USB and Serial/RS232. Using either of
these bus types, a command can be sent from the host to the chip to control the Smart Card. Because
of this control interface, testing under the CCID Specification usually involves two parts: Smart Card and
Bus type (USB or Serial/RS232).
3.2.1
USB Testing: Microsoft HCT/DTM, and USB Command Verifier
Teridian used three different tests to verify USB CCID compliance:
1.
Microsoft Hardware Compatibility Test (HCT) for Windows Logo or their updated test suite: Device
Test Manager for Vista and Windows XP, which tests CCID and PC/SC compliances.
2.
USB 2.0 Chapter 9 Test (USB Command Verifier Test).
3.
Linux Driver test using the available smart card test tool downloaded from the internet.
The HCT/DTM Smart Card test was completed in-house using the IFDTest.exe that came with HCT
version 12.01.1. (Note: This test still requires the use of older PC/SC test cards that are no longer
available for purchase) At this release, the two Vista drivers have been certified with Microsoft. The ad-
hoc testing was performed using both the TSC USB driver and the Microsoft generic USB CCID driver.
The DTM test was run and certified with Microsoft using only the TSC customized driver.
相關(guān)PDF資料
PDF描述
73S1217F-68MR/F/PE IC SOC SMART CARD READER 68QFN
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73S8014R-IL/F IC SMART CARD 7816 EMV 20-SOIC
73S8014RN-ILR/F IC SMART CARD 7816 EMV 20-SOIC
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
73S1217F-68M/F/PB 制造商:Maxim Integrated Products 功能描述:OLD P/N 73S1217F-68IM/F/P = NEW P/N 73S1217F-68M/F/PB PIN PD - Rail/Tube
73S1217F-68M/F/PE 功能描述:8位微控制器 -MCU RoHS:否 制造商:Silicon Labs 核心:8051 處理器系列:C8051F39x 數(shù)據(jù)總線寬度:8 bit 最大時(shí)鐘頻率:50 MHz 程序存儲(chǔ)器大小:16 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:1.8 V to 3.6 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:QFN-20 安裝風(fēng)格:SMD/SMT
73S1217F-68MR/F/PE 功能描述:8位微控制器 -MCU RoHS:否 制造商:Silicon Labs 核心:8051 處理器系列:C8051F39x 數(shù)據(jù)總線寬度:8 bit 最大時(shí)鐘頻率:50 MHz 程序存儲(chǔ)器大小:16 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:1.8 V to 3.6 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:QFN-20 安裝風(fēng)格:SMD/SMT
73S1217F-EB 功能描述:開(kāi)發(fā)板和工具包 - 8051 73S1217F Eval Brd (Usb Cable, Doc. Cd) RoHS:否 制造商:Silicon Labs 產(chǎn)品:Development Kits 工具用于評(píng)估:C8051F960, Si7005 核心: 接口類(lèi)型:USB 工作電源電壓:
73S1217F-EB-Lite 功能描述:開(kāi)發(fā)板和工具包 - 8051 73S1217F EVB Lite w/Plug & Play/Usb RoHS:否 制造商:Silicon Labs 產(chǎn)品:Development Kits 工具用于評(píng)估:C8051F960, Si7005 核心: 接口類(lèi)型:USB 工作電源電壓: