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參數(shù)資料
| 型號： | 5962-88721012A |
| 廠商： | ANALOG DEVICES INC |
| 元件分類： | 運算放大器 |
| 英文描述： | DUAL OP-AMP, 175 uV OFFSET-MAX, 5 MHz BAND WIDTH, CQCC20 |
| 封裝： | CERAMIC, LCC-20 |
| 文件頁數(shù)： | 3/16頁 |
| 文件大?。?/td> | 1708K |
| 代理商： | 5962-88721012A |
REV. B
–11–
OP270
NOISE MEASUREMENTS
PEAK-TO-PEAK VOLTAGE NOISE
The circuit of Figure 6 is a test setup for measuring peak-to-peak
voltage noise. To measure the 200 nV peak-to-peak noise specifica-
tion of the OP270 in the 0.1 Hz to 10 Hz range, the following
precautions must be observed:
1. The device has to be warmed up for at least five minutes. As
shown in the warm-up drift curve, the offset voltage typically
changes 2
mV due to increasing chip temperature after power-up.
In the 10-second measurement interval, these temperature
induced effects can exceed tens-of-nanovolts.
2. For similar reasons, the device has to be well-shielded from
air currents. Shielding also minimizes thermocouple effects.
3. Sudden motion in the vicinity of the device can also “feedthrough”
to increase the observed noise.
4. The test time to measure 0.1 Hz-to-10 Hz noise should not
exceed 10 seconds. As shown in the noise-tester frequency
response curve of Figure 7, the 0.1 Hz corner is defined by
only one pole. The test time of 10 seconds acts as an additional
pole to eliminate noise contribution from the frequency band
below 0.1 Hz.
100
0.01
0.1
1.0
10
100
GAIN
–
dB
80
60
40
20
0
Figure 7. 0.1 Hz To 10Hz Peak-To-Peak Voltage
Noise Test Circuit Frequency Response
5. A noise-voltage-density test is recommended when measuring
noise on a large number of units. A 10 Hz noise-voltage-density
measurement will correlate well with a 0.1 Hz-to-10 Hz
peak-to-peak noise reading, since both results are determined by
the white noise and the location of the 1/f corner frequency.
6. Power should be supplied to the test circuit by well bypassed
low-noise supplies, e.g., batteries. These will minimize output
noise introduced via the amplifier supply pins.
NOISE MEASUREMENT—NOISE VOLTAGE DENSITY
The circuit of Figure 8 shows a quick and reliable method of
measuring the noise voltage density of dual op amps. The first
amplifier is in unity-gain, with the final amplifier in a noninvert-
ing gain of 101. Since the as noise voltages of each amplifier are
uncorrelated, they add in rms fashion to yield:
ee
e
OUT
nA
nB
=+
101
22
The OP270 is a monolithic device with two identical amplifi-
ers. The noise voltage density of each individual amplifier will
match, giving:
ee
e
OUT
n
==
101
2
101
2
1/2
OP270
–
+
R1
100
1/2
OP270
–
+
R2
10k
eOUT
eOUT (nV/ Hz 101 ( 2e
n)
VS = 15V
TO SPECTRUM ANALYZER
Figure 8. Noise Voltage Density Test Circuit
OP270
DUT
–
+
R3
1.24k
R2
100k
R1
5
OP27E
–
+
R5
8.06k
en OUTTO
TO SPECTRUM ANALYZER
R4
200
GAIN = 10,000
VS = 15V
Figure 9. Current Noise Density Test Circuit
NOISE MEASUREMENT — CURRENT NOISE DENSITY
The test circuit shown in Figure 9 can be used to measure cur-
rent noise density. The formula relating the voltage output to
current noise density is:
i
e
G
nV
H
R
n
nOUT
Z
S
=
-
()
2
40
/
where:
G = gain of 10000
RS = 100 k
W source resistance
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| 59628872101PA | 制造商:AD 功能描述:OP270-009Z |
| 5962-8872101PA | 制造商:Analog Devices 功能描述:OP Amp Dual GP 制造商:Analog Devices 功能描述:OP AMP DUAL GP 18V 8CDIP - Rail/Tube 制造商:Analog Devices 功能描述:DUAL PRECISION INSTR. AMPLIFIER ((NS)) 制造商:Analog Devices Inc. 功能描述:DUAL LOW-NOISE IC 制造商:Analog Devices Inc. 功能描述:Precision Amplifiers DUAL LOW-NOISE IC |
| 5962-8872101V2A | 制造商:Analog Devices 功能描述:DUAL,LOW-NOISE IC - Rail/Tube |
| 5962-8872101VPA | 制造商:Analog Devices 功能描述:HIGH-PERFORMANCE MONOLITHIC DUAL OP AMP OP270AZ/QMLV - Rail/Tube |
| 5962-88721022A | 制造商:Rochester Electronics LLC 功能描述:DUAL, HI-SPEED IC - Bulk |
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