TSA0801
18/21
NO
T
FOR
NEW
DESI
G
N
Clock input
The converter quality is very dependant on clock
input accuracy, in terms of aperture jitter; the use
of low jitter crystal controlled oscillator is recom-
mended.
The clock power supplies must be separated from
the ADC output ones to avoid digital noise modu-
lation at the output.
It is recommended to keep the circuit clocked, to
avoid random states, before applying the supply
voltages.
Layout precautions
To use the ADC circuits in the best manner at high
frequencies, some precautions have to be taken
for power supplies:
- First of all, the implementation of 4 separate
proper supplies and ground planes (analog, digi-
tal, internal and external buffer ones) on the PCB
is recommended for high speed circuit applica-
tions to provide low inductance and low resistance
common return.
The separation of the analog signal from the digi-
tal part is essential to prevent noise from coupling
onto the input signal.
- Power supply bypass capacitors must be placed
as close as possible to the IC pins in order to
improve high frequency bypassing and reduce
harmonic distortion.
- Proper termination of all inputs and outputs must
be incorporated with output termination resistors;
then the amplifier load will be only resistive and
the stability of the amplifier will be improved. All
leads must be wide and as short as possible espe-
cially for the analog input in order to decrease par-
asitic capacitance and inductance.
- To keep the capacitive loading as low as
possible at digital outputs, short lead lengths of
routing are essential to minimize currents when
the output changes. To minimize this output
capacitance, buffers or latches close to the output
pins will relax this constraint.
- Choose component sizes as small as possible
(SMD).
EVAL0801 evaluation board
The characterization of the board has been made
with a fully ADC devoted test bench as shown on
Figure 10. The analog signal must be filtered to be
very pure.
The dataready signal is the acquisition clock of the
logic analyzer.
The ADC digital outputs are latched by the octal
buffers 74LCX573.
All characterization measurements have been
made with:
SFSR=+0.2dB
for
static
parameters.-
SFSR=-0.5dB for dynamic parameters.
Figure 10 : Analog to Digital Converter characterization bench
Sine Wave
Generator
HP8644
ADC
evaluation
board
Pulse
Generator
Logic
Analyzer
Sine Wave
Generator
HP8644
HP8133
Vin
Clk
Data
Clk
PC