
45
4431E–8051–04/06
AT/TS8xC54/8X2
5.
Typicals are based on a limited number of samples and are not guaranteed. The values listed are at room temper-
ature and 5V.
6.
Under steady state (non-transient) conditions, I
OL must be externally limited as follows:
Maximum I
OL per port pin: 10 mA
Maximum I
OL per 8-bit port:
Port 0: 26 mA
Ports 1, 2 and 3: 15 mA
Maximum total I
OL for all output pins: 71 mA
If I
OL exceeds the test condition, VOL may exceed the related specification. Pins are not guaranteed to sink current
greater than the listed test conditions.
7.
For other values, please contact your sales office.
8.
Operating I
CC is measured with all output pins disconnected; XTAL1 driven with TCLCH, TCHCL = 5 ns (see Figure IL = VSS + 0.5 V,
V
IH = VCC - 0.5V; XTAL2 N.C.; EA = Port 0 = VCC; RST = VSS. The internal ROM runs the code 80 FE (label: SJMP
label). I
CC would be slightly higher if a crystal oscillator is used. Measurements are made with OTP products when
possible, which is the worst case.
Figure 19-1. ICC Test Condition, under reset
Figure 19-2. Operating I
CC Test Condition
EA
VCC
ICC
(NC)
CL O C K
SIGNAL
VCC
All other pins are disconnected.
RST
XTAL2
XTAL1
VSS
VCC
P0
EA
V
CC
V
CC
I
CC
(NC)
CL O C K
SIGNAL
All other pins are disconnected.
RST
XTAL2
XTAL1
VSS
VCC
P0
Reset = Vss after a high pulse
during at least 24 clock cycles