參數(shù)資料
型號： TPS2045P
廠商： Texas Instruments, Inc.
英文描述： CURRENT-LIMITED POWER-DISTRIBUTION SWITCHES
中文描述： 限流配電開關
文件頁數(shù)： 5/23頁
文件大小： 406K
代理商： TPS2045P
TPS2045, TPS2055
CURRENT-LIMITED POWER-DISTRIBUTION SWITCHES
SLVS182 – APRIL 1999
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating junction temperature range, V
I(IN)
= 5.5 V,
I
O
= rated current, V
I(EN)
= 0 V, V
I(EN)
= Hi (unless otherwise noted)
power switch
PARAMETER
TEST CONDITIONS
TPS2045
TYP
TPS2055
TYP
UNIT
MIN
MAX
MIN
MAX
VI(IN) = 5 V,
IO = 0.25 A
VI(IN) = 5 V,
IO = 0.25 A
VI(IN) = 5 V,
IO = 0.25 A
VI(IN) = 3.3 V,
IO = 0.25 A
VI(IN) = 3.3 V,
IO = 0.25 A
VI(IN) = 3.3 V,
IO = 0.25 A
VI(IN) = 5.5 V,
CL = 1
μ
F,
VI(IN) = 2.7 V,
CL = 1
μ
F,
VI(IN) = 5.5 V,
CL = 1
μ
F,
VI(IN) = 2.7 V,
CL = 1
μ
F,
TJ = 25
°
C,
80
95
80
95
Static drain-source on-state
resistance, 5-V operation
TJ = 85
°
C,
90
120
90
120
rDS(on)
TJ = 125
°
C,
100
135
100
135
m
TJ = 25
°
C,
85
105
85
105
Static drain-source on-state
resistance, 3.3-V operation
TJ = 85
°
C,
100
135
100
135
TJ = 125
°
C,
115
150
115
150
tr
Rise time output
Rise time, output
TJ = 25
°
C,
RL = 20
TJ = 25
°
C,
RL = 20
TJ = 25
°
C,
RL = 20
TJ = 25
°
C,
RL = 20
2.5
2.5
ms
3
3
tf
Fall time output
Fall time, output
4.4
4.4
ms
2.5
2.5
Pulse-testing techniques maintain junction temperature close to ambient temperature; thermal effects must be taken into account separately.
enable input EN or EN
PARAMETER
TEST CONDITIONS
TPS2045
TYP
TPS2055
TYP
UNIT
MIN
MAX
MIN
MAX
VIH
High-level input voltage
2.7 V
≤
VI(IN)
≤
5.5 V
4.5 V
≤
VI(IN)
≤
5.5 V
2.7 V
≤
VI(IN)
≤
4.5 V
VI(EN) = 0 V or VI(EN) = VI(IN)
VI(EN) = VI(IN) or VI(EN) = 0 V
CL = 100
μ
F, RL = 20
CL = 100
μ
F, RL = 20
2
2
V
VIL
Low level input voltage
Low-level input voltage
0.8
0.8
V
0.4
0.4
II
Input current
TPS2045
–0.5
0.5
μ
A
TPS2055
–0.5
0.5
ton
toff
Turnon time
20
20
ms
Turnoff time
40
40
current limit
PARAMETER
TEST CONDITIONS
TPS2045
TYP
TPS2055
TYP
UNIT
MIN
MAX
MIN
MAX
IOS
Short-circuit output current
VI(IN) = 5 V, OUT connected to GND,
Device enabled into short circuit
0.345
0.44
0.525
0.345
0.44
0.525
A
Pulse-testing techniques maintain junction temperature close to ambient temperature; thermal effects must be taken into account separately.
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