參數(shù)資料
型號(hào)： TMDS37788OTP
廠商： Texas Instruments, Inc.
英文描述： TMS370 MICROCONTROLLER FAMILY DATA BOOK
中文描述： TMS370微控制器系列數(shù)據(jù)手冊(cè)
文件頁(yè)數(shù)： 50/78頁(yè)
文件大?。?/td> 919K
代理商： TMDS37788OTP
RELIABILITY STRESS TESTS
2–4
POST OFFICE BOX 1443
HOUSTON, TEXAS 77251–1443
reliability stress tests
Accelerated stress tests are performed on new semiconductor products and process changes to qualify them
and to ensure excellence in product reliability. The following test environments are typical:
High-temperature operating life
Storage life
Temperature cycling
Biased humidity
Autoclave
Electrostatic discharge
Package integrity
Electromigration
Channel-hot electrons (performed on geometries of less than 2.0
μ
m)
Typical events or changes that require internal requalification of a product include the following:
New die design, shrink, or layout
Wafer process (baseline/control systems, flow, mask, chemicals, gases, dopants, passivation, or metal
systems)
Packaging assembly (baseline control systems or critical assembly equipment)
Piece parts (such as lead frame, mold compound, mount material, bond wire, or lead finish)
Manufacturing site
TI reliability control systems extend beyond qualification. Total reliability controls and management include
product reliability monitoring as well as final product release controls. Metal oxide semiconductor (MOS)
memories, utilizing high-density active elements, serve as the leading indicator in wafer-process integrity at TI
MOS fabrication sites, enhancing all MOS-logic device yields and reliability. Monthly, TI places several thousand
MOS devices on reliability tests to ensure and sustain built-in product excellence.
Table 1 lists the microprocessor and microcontroller reliability tests, the duration of the tests, and the size of the
samples. Table 2 contains definitions and descriptions of the terms used in these tests.
相關(guān)PDF資料
PDF描述
TMDS3780510A TMS370 MICROCONTROLLER FAMILY DATA BOOK
TMDS3780511A TMS370 MICROCONTROLLER FAMILY DATA BOOK
TMDS3780513A TMS370 MICROCONTROLLER FAMILY DATA BOOK
TMDS3780514A TMS370 MICROCONTROLLER FAMILY DATA BOOK
TMDS3788828 TMS370 MICROCONTROLLER FAMILY DATA BOOK
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
TMDS3780510A 制造商:TI 制造商全稱:Texas Instruments 功能描述:TMS370 MICROCONTROLLER FAMILY DATA BOOK
TMDS3780511A 功能描述:程序設(shè)計(jì)器 - 基于處理器 TMS370 Programmer RoHS:否 制造商:Olimex Ltd. 產(chǎn)品:Programmers 工具用于評(píng)估:XMEGA, MegaAVR, tinyAVR 核心:AVR 接口類型:USB 工作電源電壓:1.8 V to 5.5 V
TMDS3780512A 功能描述:程序設(shè)計(jì)器 - 基于處理器 TMS370 Programmer RoHS:否 制造商:Olimex Ltd. 產(chǎn)品:Programmers 工具用于評(píng)估:XMEGA, MegaAVR, tinyAVR 核心:AVR 接口類型:USB 工作電源電壓:1.8 V to 5.5 V
TMDS3780513A 制造商:TI 制造商全稱:Texas Instruments 功能描述:TMS370 MICROCONTROLLER FAMILY DATA BOOK
TMDS3780514A 制造商:TI 制造商全稱:Texas Instruments 功能描述:TMS370 MICROCONTROLLER FAMILY DATA BOOK
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