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參數(shù)資料
| 型號(hào)： | TLV5580IPWR |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | ADC |
| 英文描述： | 1-CH 8-BIT PROPRIETARY METHOD ADC, PARALLEL ACCESS, PDSO28 |
| 封裝： | GREEN, PLASTIC, TSSOP-28 |
| 文件頁數(shù)： | 34/36頁 |
| 文件大小： | 478K |
| 代理商： | TLV5580IPWR |
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TLV5580
8BIT, 80 MSPS LOW POWER A/D CONVERTER
SLAS205B DECEMBER 1998 REVISED OCTOBER 2003
www.ti.com
7
ELECTRICAL CHARACTERISTICS OVER RECOMMENDED OPERATING CONDITIONS WITH FCLK = 80
MSPS AND USE OF EXTERNAL VOLTAGE REFERENCES (unless otherwise noted)
DC ACCURACY
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Integral nonlinearity (INL), best-fit
Internal references (see Note 1)
TA = 40°C to 85°C
2.4
±1
2.4
LSB
Integral nonlinearity (INL), best-fit
Internal references (see Note 1)
TA = 40°C to 85°C
2.4
±1
2.4
LSB
Differential nonlinearity (DNL)
Internal references (see Note 2)
TA = 40°C to 85°C
1
±0.6
1.3
LSB
Zero error
AVDD = DVDD = 3.3 V, DRVDD = 3 V
See Note 3
5
%FS
Full scale error
AVDD = DVDD = 3.3 V, DRVDD = 3 V
See Note 3
5
%FS
1. Integral nonlinearity refers to the deviation of each individual code from a line drawn from zero to full scale. The point used as zero
occurs 1/2 LSB before the first code transition. The fullscale point is defined as a level 1/2 LSB beyond the last code transition. The deviation
is measured from the center of each particular code to the true straight line between these two endpoints.
2. An ideal ADC exhibits code transitions that are exactly 1 LSB apart. DNL is the deviation from this ideal value. Therefore this measure indicates
how uniform the transfer function step sizes are. The ideal step size is defined here as the step size for the device under test (i.e., (last transition
level first transition level)
÷ (2n 2)). Using this definition for DNL separates the effects of gain and offset error. A minimum DNL better than 1
LSB ensures no missing codes.
3. Zero error is defined as the difference in analog input voltage between the ideal voltage and the actual voltage that will switch the ADC output
from code 0 to code 1. The ideal voltage level is determined by adding the voltage corresponding to 1/2 LSB to the bottom reference level. The
voltage corresponding to 1 LSB is found from the difference of top and bottom references divided by the number of ADC output levels (256).
Full-scale error is defined as the difference in analog input voltage – between the ideal voltage and the actual voltage – that will switch the ADC
output from code 254 to code 255. The ideal voltage level is determined by subtracting the voltage corresponding to 1.5 LSB from the top reference
level. The voltage corresponding to 1 LSB is found from the difference of top and bottom references divided by the number of ADC output levels
(256).
ANALOG INPUT
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
CI
Input capacitance
4
pF
REFERENCE INPUT (AVDD = DVDD = DRVDD = 3.6 V)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Rref
Reference input resistance
200
Iref
Reference input current
5
mA
REFERENCE OUTPUTS
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
V(REFTO)
Reference top offset voltage
Absolute min/max values valid
2.07
2 + [(AVDD 3) ÷ 2]
2.21
V
V(REFBO)
Reference bottom offset voltage
Absolute min/max values valid
and tested for AVDD = 3.3 V
1.09
1 + [(AVDD 3) ÷ 2]
1.21
V
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| TLV5580IPWRG4 | 功能描述:模數(shù)轉(zhuǎn)換器 - ADC 8Bit 80MSPS 1-Ch High Ch Band Lo-Pwr RoHS:否 制造商:Texas Instruments 通道數(shù)量:2 結(jié)構(gòu):Sigma-Delta 轉(zhuǎn)換速率:125 SPs to 8 KSPs 分辨率:24 bit 輸入類型:Differential 信噪比:107 dB 接口類型:SPI 工作電源電壓:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:VQFN-32 |
| TLV5580PW | 制造商:TI 制造商全稱:Texas Instruments 功能描述:8-BIT, 80 MSPS LOW-POWER A/D CONVERTER |
| TLV5590 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:2-BIT ANALOG-TO-DIGITAL CONVERTER FOR FLEX |
| TLV5590ED | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| TLV5590EDR | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
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