參數(shù)資料
型號(hào): TLV5510INS
廠商: Texas Instruments, Inc.
英文描述: 2.7-V TO 3.6-V 8-BIT HIGH-SPEED ANALOG-TO-DIGITAL CONVERTER
中文描述: 2.7 - V到3.6V的8位高速模擬數(shù)字轉(zhuǎn)換器
文件頁(yè)數(shù): 11/19頁(yè)
文件大?。?/td> 307K
代理商: TLV5510INS
TLV5510
2.7-V TO 3.6-V 8-BIT HIGH-SPEED ANALOG-TO-DIGITAL CONVERTER
SLAS124C– DECEMBER 1997 – REVISED DECEMBER 1999
11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
APPLICATION INFORMATION
The following notes are design recommendations that should be used with the TLV5510.
External analog and digital circuitry should be physically separated and shielded as much as possible to
reduce system noise.
RF breadboarding or printed-circuit-board (PCB) techniques should be used throughout the evaluation and
production process. Breadboards should be copper clad for bench evaluation.
Since AGND and DGND are connected internally, the ground lead in must be kept as noise free as possible.
A good method to use is twisted-pair cables for the supply lines to minimize noise pickup. An analog and
digital ground plane should be used on PCB layouts when additional logic devices are used. The AGND
and DGND terminals of the device should be tied to the analog ground plane.
V
DDA
to AGND and V
DDD
to DGND should be decoupled with 1-
μ
F and 0.01-
μ
F capacitors, respectively,
placed as close as possible to the appropriate device terminals. A ceramic chip capacitor is recommended
for the 0.01-
μ
F capacitor. Care should be exercised to assure a solid noise-free ground connection for the
analog and digital grounds.
V
DDA
, AGND, and ANALOG IN terminals should be shielded from the higher frequency terminals, CLK and
D0–D7. If possible, AGND traces should be placed on both sides of the ANALOG IN traces on the PCB for
shielding.
In testing or application of the device, the resistance of the driving source connected to the analog input
should be 10
or less within the analog frequency range of interest.
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