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參數(shù)資料
| 型號(hào)： | TLC5540CPWR |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | 8-BIT HIGH-SPEED ANALOG-TO-DIGITAL CONVERTER |
| 中文描述： | 8位高速模擬數(shù)字轉(zhuǎn)換器 |
| 文件頁(yè)數(shù)： | 11/18頁(yè) |
| 文件大?。?/td> | 230K |
| 代理商： | TLC5540CPWR |
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SLAS105D JANUARY 1995 REVISED APRIL 2004
www.ti.com
11
PRINCIPLES OF OPERATION
functional description
The TLC5540 uses a modified semiflash architecture as shown in the functional block diagram. The four most
significant bits (MSBs) of every output conversion result are produced by the upper comparator block CB1. The
four least significant bits (LSBs) of each alternate output conversion result are produced by the lower
comparator blocks CB-A and CB-B in turn (see Figure 12).
The reference voltage that is applied to the lower comparator resistor string is one sixteenth of the amplitude
of the refence applied to the upper comparator resistor string. The sampling comparators of the lower
comparator block require more time to sample the lower voltages of the reference and residual input voltage.
By applying the residual input voltage to alternate lower comparator blocks, each comparator block has twice
as much time to sample and convert as would be the case if only one lower comparator block were used.
VI(1)
VI(2)
VI(3)
VI(4)
CLK1
CLK2
CLK3
CLK4
S(1)
C(1)
S(2)
C(2)
S(3)
C(3)
S(4)
C(4)
S(1)
H(1)
C(1)
S(3)
H(3)
C(3)
H(0)
C(0)
S(2)
H(2)
C(2)
S(4)
H(4)
LD(2)
OUT(2)
OUT(1)
OUT(0)
OUT(1)
ANALOG IN
(Sampling Points)
CLK (Clock)
Upper Comparators Block (CB1)
Upper Data
Lower Reference Voltage
Lower Comparators Block (CB-A)
Lower Data (A)
Lower Comparators Block (CB-B)
Lower Data (B)
D1D8 (Data Output)
UD(0)
RV(0)
UD(1)
RV(1)
UD(2)
RV(2)
UD(3)
RV(3)
LD(1)
LD(0)
LD(1)
LD(2)
tpd
Figure 12. Internal Functional Timing Diagram
This conversion scheme, which reduces the required sampling comparators by 30 percent compared to
standard semiflash architectures, achieves significantly higher sample rates than the conventional semiflash
conversion method.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| TLC5540CPWRG4 | 功能描述:模數(shù)轉(zhuǎn)換器 - ADC 8-Bit 40 MSPS 1-Ch Internal S&H Lo Pwr RoHS:否 制造商:Texas Instruments 通道數(shù)量:2 結(jié)構(gòu):Sigma-Delta 轉(zhuǎn)換速率:125 SPs to 8 KSPs 分辨率:24 bit 輸入類型:Differential 信噪比:107 dB 接口類型:SPI 工作電源電壓:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:VQFN-32 |
| TLC5540EVM | 功能描述:數(shù)據(jù)轉(zhuǎn)換 IC 開(kāi)發(fā)工具 TLC5540 Eval Mod RoHS:否 制造商:Texas Instruments 產(chǎn)品:Demonstration Kits 類型:ADC 工具用于評(píng)估:ADS130E08 接口類型:SPI 工作電源電壓:- 6 V to + 6 V |
| TLC5540INS | 功能描述:模數(shù)轉(zhuǎn)換器 - ADC 8B,40MSPS ADC Sgl Ch Internal S&H,Lo Pwr RoHS:否 制造商:Texas Instruments 通道數(shù)量:2 結(jié)構(gòu):Sigma-Delta 轉(zhuǎn)換速率:125 SPs to 8 KSPs 分辨率:24 bit 輸入類型:Differential 信噪比:107 dB 接口類型:SPI 工作電源電壓:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:VQFN-32 |
| TLC5540INS | 制造商:Texas Instruments 功能描述:IC 8BIT ADC SMD 5540 SOIC24 |
| TLC5540INSG4 | 功能描述:模數(shù)轉(zhuǎn)換器 - ADC 8B,40 MSPS ADC RoHS:否 制造商:Texas Instruments 通道數(shù)量:2 結(jié)構(gòu):Sigma-Delta 轉(zhuǎn)換速率:125 SPs to 8 KSPs 分辨率:24 bit 輸入類型:Differential 信噪比:107 dB 接口類型:SPI 工作電源電壓:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:VQFN-32 |
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