參數(shù)資料
型號: THS3201MDREP
廠商: TEXAS INSTRUMENTS INC
元件分類: 音頻/視頻放大
英文描述: 1 CHANNEL, VIDEO AMPLIFIER, PDSO8
封裝: SOIC-8
文件頁數(shù): 12/29頁
文件大?。?/td> 709K
代理商: THS3201MDREP
_
+
768
+7.5 V
49.9
VI
-7.5 V
50
Source
Low-Noise, Low-Distortion, Wideband Application Circuit
NOTE: Power supply decoupling capacitors not shown
768
50
THS3201
49.9
50
0
1
2
3
4
5
6
7
8
100 k
1 M
10 M
100 M
1 G
10 G
f - Frequency - Hz
Noninverting
Gain
-
dB
NONINVERTING SMALL SIGNAL
FREQUENCY RESPONSE
RF = 768
Gain = 2.
RL = 100 ,
VO = 0.2 VPP.
VS = ±7.5 V
ABSOLUTE MAXIMUM RATINGS
(1)
SGLS283B – APRIL 2005 – REVISED JANUARY 2009 ..................................................................................................................................................... www.ti.com
over operating free-air temperature range (unless otherwise noted)
VS
Supply voltage
16.5 V
VI
Input voltage
±VS
IO
Output current
175 mA
VID
Differential input voltage
±3 V
Continuous power dissipation
See Dissipation Ratings Table
TJ
Maximum junction temperature(2)
150°C
TJ
Maximum junction temperature, continuous operation, long-term reliability(3)
125°C
Tstg
Storage temperature range
–65°C to 150°C
Lead temperature 1,6 mm (1/16 in) from case for 10 s
300°C
Human body model
3000 V
ESD ratings
Charged device model
1500 V
Machines model
100 V
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2)
The absolute maximum ratings under any condition are limited by the constraints of the silicon process. Stresses above these ratings
may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. These
are stress ratings only, and functional operation of the device at these or any other conditions beyond those specified is not implied.
(3)
Long-term high-temperature storage and/or extended use at maximum recommended operating conditions may result in a reduction of
overall device life. See Figure 1 for additional information on thermal derating.
2
Copyright 2005–2009, Texas Instruments Incorporated
Product Folder Link(s): THS3201-EP
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