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| 型號： | SN74ABT8952DLR |
| 廠商： | Texas Instruments |
| 文件頁數(shù)： | 13/31頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC SCAN TESST DEVICE 28-SSOP |
| 標準包裝： | 1,000 |
| 系列： | 74ABT |
| 邏輯類型： | 掃描測試設(shè)備，帶寄存總線收發(fā)器 |
| 電源電壓： | 4.5 V ~ 5.5 V |
| 位數(shù)： | 8 |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 28-BSSOP（0.295"，7.50mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 28-SSOP |
| 包裝： | 帶卷 (TR) |
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SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
20
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TA = 25°C
SN54ABT8952
SN74ABT8952
UNIT
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNIT
VIK
VCC = 4.5 V,
II = –18 mA
–1.2
V
VCC = 4.5 V,
IOH = –3 mA
2.5
VOH
VCC = 5 V,
IOH = –3 mA
3
V
VOH
VCC =4 5V
IOH = –24 mA
2
V
VCC = 4.5 V
IOH = –32 mA
2*
2
VOL
VCC =4 5V
IOL = 48 mA
0.55
V
VOL
VCC = 4.5 V
IOL = 64 mA
0.55*
0.55
V
II
VCC = 5.5 V,
VI =VCC or GND
CLK, CLKEN,
OE, TCK
±1
A
I
VI = VCC or GND
A or B ports
±100
IIH
VCC = 5.5 V,
VI = VCC
TDI, TMS
10
A
IIL
VCC = 5.5 V,
VI = GND
TDI, TMS
–40
–160
–40
–160
–40
–160
A
IOZH
VCC = 5.5 V,
VO = 2.7 V
50
A
IOZL
VCC = 5.5 V,
VO = 0.5 V
–50
A
Ioff
VCC = 0,
VI or VO ≤ 4.5 V
±100
A
IOZPU
VCC = 0 to 2 V,
VO = 0.5 V or 2.7 V
±50
A
IOZPD
VCC = 2 V to 0,
VO = 0.5 V or 2.7 V
±50
A
ICEX
VCC = 5.5 V,
VO = 5.5 V
Outputs high
50
A
IO§
VCC = 5.5 V,
VO = 2.5 V
–50
–100
–180
–50
–180
–50
–180
mA
VCC = 5.5 V,
AB
Outputs high
0.9
2
ICC
VCC = 5.5 V,
IO = 0,
A or B
ports
Outputs low
30
38
mA
VI = VCC or GND
orts
Outputs disabled
0.9
2
ICC
VCC = 5.5 V, One input at 3.4 V,
15
mA
ICC
CC
,,
Other inputs at VCC or GND
1.5
mA
Ci
VI = 2.5 V or 0.5 V
Control inputs
3
pF
Cio
VO = 2.5 V or 0.5 V
A or B ports
10
pF
Co
VO = 2.5 V or 0.5 V
TDO
8
pF
* On products compliant to MIL-PRF-38535, this parameter does not apply.
All typical values are at VCC = 5 V.
The parameters IOZH and IOZL include the input leakage current.
§ Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
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