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參數(shù)資料
| 型號： | SN74ABT657ANTE4 |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | ABT SERIES, 8-BIT TRANSCEIVER, TRUE OUTPUT, PDIP24 |
| 封裝： | ROHS COMPLIANT, PLASTIC, DIP-24 |
| 文件頁數(shù)： | 10/13頁 |
| 文件大?。?/td> | 353K |
| 代理商： | SN74ABT657ANTE4 |
SN54ABT657A, SN74ABT657A
OCTAL TRANSCEIVERS WITH PARITY GENERATORS/CHECKERS
AND 3-STATE OUTPUTS
SCBS192E – JANUARY 1991 – REVISED JUNE 1997
6
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TA = 25°C
SN54ABT657A
SN74ABT657A
UNIT
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
MIN
MAX
MIN
MAX
UNIT
VIK
VCC = 4.5 V,
II = –18 mA
–1.2
V
VCC = 4.5 V,
IOH = –3 mA
2.5
VOH
VCC = 5 V,
IOH = –3 mA
3
V
VOH
VCC =4 5V
IOH = –24 mA
2
V
VCC = 4.5 V
IOH = –32 mA
2*
2
VOL
VCC =4 5V
IOL = 48 mA
0.55
V
VOL
VCC = 4.5 V
IOL = 64 mA
0.55*
0.55
V
Vhys
100
mV
II
Control inputs
VCC = 0 to 5.5 V, VI = VCC or GND
±1
A
II
A or B ports
VCC = 2.1 V to 5.5 V, VI = VCC or GND
±20
A
IOZPU
VCC = 0 to 2.1 V, VO = 0.5 V to 2.7 V,
OE = X
±50
A
IOZPD
VCC = 2.1 V to 0, VO = 0.5 V to 2.7 V,
OE = X
±50
A
IOZH§
VCC = 2.1 V to 5.5 V, VO = 2.7 V,
OE
≥ 2 V
10
A
IOZL§
VCC = 2.1 V to 5.5 V, VO = 0.5 V,
OE
≥ 2 V
–10
A
Ioff
VCC = 0,
VI or VO ≤ 4.5 V
±100
A
ICEX
VCC = 5.5 V,
VO = 5.5 V
Outputs high
50
A
IO
VCC = 5.5 V,
VO = 2.5 V
–50
–100
–200
–50
–200
–50
–200
mA
VCC = 5.5 V,
Outputs high
250
A
ICC
VCC = 5.5 V,
IO = 0,
Outputs low
40
mA
VI = VCC or GND
Outputs disabled
250
A
Data inputs
VCC = 5.5 V,
One input at 3.4 V,
Outputs enabled
1.5
ICC#
Data inputs
,
Other inputs at
VCC or GND
Outputs disabled
0.25
mA
Control inputs
VCC = 5.5 V, One input at 3.4 V,
Other inputs at VCC or GND
1.5
Ci
Control inputs
VI = 2.5 V or 0.5 V
4
pF
Cio
A or B ports
VO = 2.5 V or 0.5 V
10
pF
* On products compliant to MIL-PRF-38535, this parameter does not apply.
All typical values are at VCC = 5 V.
This parameter is characterized, but not production tested.
§ The parameters IOZH and IOZL include the input leakage current.
Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
# This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
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