參數(shù)資料
型號(hào)： SN54ABT18502A
廠商： Texas Instruments, Inc.
英文描述： Scan Test Devices With 18-Bit Universal Bus Transceivers(掃描測(cè)試裝置(帶18位通用總線收發(fā)器))
中文描述： 掃描測(cè)試設(shè)備與18位通用總線收發(fā)器（掃描測(cè)試裝置（帶18位通用總線收發(fā)器））
文件頁(yè)數(shù)： 11/35頁(yè)
文件大?。?/td> 738K
代理商： SN54ABT18502A
SN54ABT18502A, SN54ABT182502A, SN74ABT18502A, SN74ABT182502A
SCAN TEST DEVICES WITH
18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS488 – AUGUST 1994
11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
boundary-control register
The boundary-control register (BCR) is three bits long. The BCR is used in the context of the RUNT instruction
to implement additional test operations not included in the basic SCOPE
instruction set. Such operations
include PRPG, PSA, and binary count up (COUNT). Table 4 shows the test operations decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 010, which selects the PSA test operation.
The BCR order of scan is illustrated in Figure 3.
Bit 0
(LSB)
TDO
TDI
Bit 1
Bit 2
(MSB)
Figure 3. Boundary-Control Register Order of Scan
bypass register
The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path,
reducing the number of bits per test pattern that must be applied to complete a test operation.
During Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is illustrated in
Figure 4.
Bit 0
TDO
TDI
Figure 4. Bypass Register Order of Scan
P
相關(guān)PDF資料
PDF描述
SN74AHC16245 16-Bit Bus Transceivers With 3-State Outputs(16位緩沖器/驅(qū)動(dòng)器(三態(tài)輸出))
SN74AHC240DBRG4 OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
SN74AHCT27 Triple 3-Input Positive-NOR Gates(三3輸入正或非門)
SN54AHCT27 Triple 3-Input Positive-NOR Gates(三3輸入正或非門)
SN74ALVC16240 16-Bit Buffers/Drivers With 3-State Outputs(16位緩沖器/驅(qū)動(dòng)器(三態(tài)輸出))
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN54ABT18502HV 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICE WITH 18-BIT REGISTERED BUS TRANSCEIVER
SN54ABT18504 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABT18504_08 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABT18504HV 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN54ABT18640 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 18-BIT INVERTING BUS TRANSCEIVERS
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。

采購(gòu)需求

(若只采購(gòu)一條型號(hào)，填寫一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

*型號(hào) *數(shù)量 廠商 批號(hào) 封裝
添加更多采購(gòu)

我的聯(lián)系方式

*
*
*