參數(shù)資料
型號: SD12CT1_07
廠商: ON SEMICONDUCTOR
元件分類: TVS-瞬態(tài)抑制二極管
英文描述: Transient Voltage Suppressor
中文描述: 瞬態(tài)電壓抑制器
文件頁數(shù): 2/3頁
文件大小: 48K
代理商: SD12CT1_07
BiDirectional TVS
I
PP
I
PP
V
I
I
R
I
T
I
T
I
R
V
RWM
V
C
V
BR
V
RWM
V
C
V
BR
SD12CT1
http://onsemi.com
2
MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Peak Power Dissipation @ 20 s @ T
L
25
°
C
P
pk
350
W
IEC 6100042 (ESD)
Air
Contact
±
30
±
30
kV
IEC 6100044 (EFT)
40
A
Total Device Dissipation FR5 Board,
(Note 1) @ T
= 25
°
C
Derate above 25
°
C
P
D
200
1.5
mW
mW/
°
C
Thermal Resistance from JunctiontoAmbient
R
JA
635
°
C/W
Junction and Storage Temperature Range
T
J
, T
stg
65 to +150
°
C
Lead Solder Temperature Maximum (10 Second Duration)
T
L
260
°
C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. Minimum Solder Footprint.
ELECTRICAL CHARACTERISTICS
(T
A
= 25
°
C unless otherwise noted)
Symbol
Parameter
I
PP
Maximum Reverse Peak Pulse Current
V
C
Clamping Voltage @ I
PP
V
RWM
Working Peak Reverse Voltage
I
R
Maximum Reverse Leakage Current @ V
RWM
V
BR
Breakdown Voltage @ I
T
I
T
Test Current
V
BR
Maximum Temperature Variation of V
BR
ELECTRICAL CHARACTERISTICS
(T
J
= 25
°
C, unless otherwise specified)
Parameter
Conditions
Symbol
Min
Typ
Max
Unit
Reverse Working Voltage
(Note 2)
V
RWM
12
V
Breakdown Voltage
I
T
= 1 mA, (Note 3)
V
BR
13.3
V
Reverse Leakage Current
V
RWM
= 12 V
I
R
1.0
A
Clamping Voltage
Additional Clamping Voltage
I
PP
= 5 A, (8 x 20 sec Waveform)
I
PP
= 15 A, (8 x 20 sec Waveform)
V
C
19
24
V
Maximum Peak Pulse Current
8 x 20 sec Waveform
I
PP
15
A
Capacitance
V
R
= 0 V, f = 1 MHz
C
j
64
pF
V
R
= 12 V, f = 1 MHz
36
2. TVS devices are normally selected according to the working peak reverse voltage (V
RWM
), which should be equal or greater than the DC
or continuous peak operating voltage level.
3. V
BR
is measured at pulse test current I
T
.
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