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參數(shù)資料
| 型號： | SAA4995WP |
| 廠商： | NXP SEMICONDUCTORS |
| 元件分類： | 消費家電 |
| 英文描述： | Panorama-IC (PAN-IC)(全景畫面IC) |
| 中文描述： | SPECIALTY CONSUMER CIRCUIT, PQCC44 |
| 封裝： | PLASTIC, SOT-187, LCC-44 |
| 文件頁數(shù)： | 6/16頁 |
| 文件大小： | 107K |
| 代理商： | SAA4995WP |
1997 Jun 10
6
Philips Semiconductors
Preliminary specification
PANorama-IC (PAN-IC)
SAA4995WP
Interpolation function
The interpolation for phase positions between the original
samples, is achieved with a variable phase delay filter with
10 taps for luminance signals and 4 taps for chrominance
signals. For luminance the PAN-IC supplies samples up to
32 MHz. For chrominance the PAN-IC supplies each
U and V samples with a data rate of 8 MHz (max).
Processing control in the PAN-IC
The compress factor (see Fig.4) at any position in the lines
is a function of the dynamically changing DTO-increment.
When DTO
incr
= 255, the sample rate is divided by 2; when
DTO
incr
= 0, the sample rate in the PAN-IC remains
unchanged; when DTO
incr
=
128, the sample rate is
doubled.
Control of number of samples per line
Three possibilities exist for the relationship between the
end of WE
I
and the required number of samples per line for
storage in the field memory:
WE
I
negative edge coincides with the required last
sample in the line; standard operation.
WE
I
negative edge is reached before the present last
sample in the line was required; extra dummy WE cycles
will be generated at the maximum rate (zoom factor 2)
to arrive at the required number of samples per line.
The required number of samples per line is reached
before WE
I
negative edge; the DTO calculations will
continue until the required number of samples is
reached, but without generation of WE cycles.
The programmed number of samples per line is thus
always realized, independent of all other controls (unless
the line period becomes insufficient to store up to the last
sample in a line). When using odd/even sample
distribution, the programmed number of samples refers to
the number of samples in each data stream.
Consequently, the total number of samples is twice as
many.
There is an offset in the programmed number of samples
compared to the effective number of samples per line.
Effective number of Y samples = 4
×
(programmed
number of samples + 1)
Effective number of UV samples = 1
×
(programmed
number of samples + 1)
SECAM Y notch
A notch filter at the Y input of the PAN-IC can be switched
on. The purpose of this filter is to prevent artefacts from
scan velocity modulation with SECAM inputs. The notch
filter is an FIR filter with coefficients (
1 0 3 0 3 0
1).
When f
s
= 16 MHz, the notch frequency is 4 MHz; the
maximum gain of the filter is +3 dB at 2 and 6 MHz.
Timing
The inputs are related to CL16 (half system clock). This
clock is used for reference in the PAN-IC from the CL16
pin. The system clock must have a fixed phase relationship
to the CL16 enable signal (one clock system).
Relationship of WE to video data
WE inputs and outputs may be used with either coincident
or advanced WE to video timing (see Fig.5). The advanced
WE to video timing is applicable to field memories, such as
the SAA4955TJ. The input and output WEs of the PAN-IC
can be programmed separately to either timing by the
in-phase and out-phase bits.
Odd/even sample distribution
The PAN-IC usually delivers a complete YUV data stream
to one receiving device, e.g. a field memory. Optionally, a
data stream can be split into odd and even samples, to be
received by two receiving devices.
The relationship between Y and UV samples is then
non-trivial (see Tables 1 to 4).
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