參數(shù)資料
型號: PG0085.473T
廠商: PULSE ELECTRONICS CORP
元件分類: 通用定值電感
英文描述: 1 ELEMENT, 47 uH, GENERAL PURPOSE INDUCTOR, SMD
文件頁數(shù): 2/2頁
文件大?。?/td> 151K
代理商: PG0085.473T
USA 858 674 8100 Germany 49 7032 7806 0 Singapore 65 6287 8998 Shanghai 86 21 54643211 / 2 China 86 755 33966678 Taiwan 886 3 4641811
www.pulseeng.com
43
SPM2006 (7/07)
SMT POWER INDUCTORS
Shielded Drum Core Series
Notes from Tables (pages 27 - 42)
1. Unless otherwise specified, all testing is made at
100kHz, 0.1VAC.
2. Optional Tape & Reel packaging can be ordered by
adding a "T" suffix to the part number (i.e. P1166.102
becomes P1166.102T). Pulse complies with industry
standard Tape and Tape & Reel specification EIA481.
3. To order RoHS compliant part, add the suffix "NL"
to the part number (i.e. P1166.102 becomes
P1166.102NL
and
P1166.102T
becomes
P1166.102NLT).
4. Temperature of the component (ambient plus
temperature rise) must be within specified operating
temperature range.
5. The rated current (Irated) as listed is either the satura-
tion current or the heating current depending on which
value is lower.
6. The saturation current, Isat, is the current at which
the component inductance drops by the indicated
percentage (typical) at an ambient temperature of
25°C. This current is determined by placing the
component in the specified ambient environment and
applying a short duration pulse current (to eliminate
self-heating effects) to the component.
7. The heating current, Idc, is the DC current required
to raise the component temperature by the indicated
delta (approximately). The heating current is
determined by mounting the component on a
typical PCB and applying current for 30 minutes. The
temperature is measured by placing the thermocouple
on top of the unit under test.
8. In high volt*time (Et) or ripple current applications, addi-
tional heating in the component can occur due to core
losses in the inductor which may necessitate derating
the current in order to limit the temperature rise of the
component. In order to determine the approximate total
loss (or temperature rise) for a given application, both
copper losses and core losses should be taken into
account.
Estimated Temperature Rise:
Trise = [Total loss (mW) / K0].833 (oC )
Total loss = Copper loss + Core loss (mW)
Copper loss = IRMS2 x DCR (Typical) (mW)
Irms = [IDC2 +
ΔI2/12]1/2 (A)
Core loss = K1 x f (kHz)1.23 x Bac(Ga)2.38 (mW)
Bac (peak to peak flux density) = K2 x
ΔI (Ga)
[= K2/L(H) x Et(V-Sec) (Ga)]
where f varies between 25kHz and 1MHz, and Bac is
less than 2500 Gauss.
K2 is a core size and winding dependant value and
is given for each p/n in the proceeding datasheets.
K0 & K1 are platform and material dependant constants
and are given in the table below for each platform.
PG0085/86
2.3
5.29E-10
PG0087
5.8
15.2E-10
PG0040/41
0.8
2.80E-10
P1174
0.8
6.47E-10
PF0601
4.6
14.0E-10
PF0464
3.6
24.7E-10
PF0465
3.6
33.4E-10
P1166
1.9
29.6E-10
P1167
2.1
42.2E-10
PF0560NL
5.5
136E-10
P1168/69
4.8
184E-10
P1170/71
4.3
201E-10
P1172/73
5.6
411E-10
PF0552NL
8.3
201E-10
PF0553NL
7.1
411E-10
Part No.
Trise Factor
Core Loss Factor
(K0 )
(K1)
Take note that the component's temperature rise varies depending on the system condition. It is suggested that the
component be tested at the system level, to verify the temperature rise of the component during system operation.
CoreLoss/K1 Vs Flux Density
0
0.50E+10
1.00E+10
1.50E+10
2.00E+10
2.50E+10
3.00E+10
0
500
1000
1500
2000
2500
DB (Gauss)
where DB = K2 x DI [= K2/L(H) x Et(V-Sec)]
Core
Loss
/K1
(mW)
100KHz
200KHz
300KHz
400KHz
500KHz
700KHz
1.0MHz
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