
1-Gbit P30 Family
Datasheet
Intel StrataFlash
Embedded Memory (P30)
Order Number: 306666, Revision: 001
April 2005
21
VCCQ
Power
Output Power Supply:
Output-driver source voltage.
VSS
Power
Ground:
Connect to system ground. Do not float any VSS connection.
RFU
—
Reserved for Future Use:
Reserved by Intel for future device functionality and enhancement. These
should be treated in the same way as a Do Not Use (DU) signal.
DU
—
Do Not Use:
Do not connect to any other signal, or power supply; must be left floating.
NC
—
No Connect:
No internal connection; can be driven or floated.
Table 3.
TSOP and Easy BGA Signal Descriptions (Sheet 2 of 2)
Symbol
Type
Name and Function
Table 4.
QUAD+ SCSP Signal Descriptions (Sheet 1 of 2)
Symbol
Type
Name and Function
A[MAX:0]
Input
ADDRESS INPUTS:
Device address inputs. 64-Mbit: A[21:0]; 128-Mbit: A[22:0]; 256-Mbit: A[23:0];
512-Mbit: A[24:0].
See
Table 6 on page 22
,
Figure 11 on page 23
, and
Figure 12 on page 23
for 512-Mbit and 1-Gbit
addressing.
DQ[15:0]
Input/
Output
DATA INPUT/OUTPUTS:
Inputs data and commands during write cycles; outputs data during
memory, Status Register, Protection Register, and Read Configuration Register reads. Data balls
float when the CE# or OE# are deasserted. Data is internally latched during writes.
ADV#
Input
ADDRESS VALID:
Active low input. During synchronous read operations, addresses are latched on
the rising edge of ADV#, or on the next valid CLK edge with ADV# low, whichever occurs first.
In asynchronous mode, the address is latched when ADV# going high or continuously flows through
if ADV# is held low.
WARNING: Designs not using ADV# must tie it to VSS to allow addresses to flow through.
F1-CE#
F2-CE#
Input
FLASH CHIP ENABLE:
Active low input. CE# low selects the associated flash memory die. When
deasserted, the associated flash die is deselected, power is reduced to standby levels, data and
WAIT outputs are placed in high-Z state.
See
Table 6 on page 22
for CE# assignment definitions.
WARNING: All chip enables must be high when device is not in use.
CLK
Input
CLOCK:
Synchronizes the device with the system’s bus frequency in synchronous-read mode.
During synchronous read operations, addresses are latched on the rising edge of ADV#, or on the
next valid CLK edge with ADV# low, whichever occurs first.
WARNING: Designs not using CLK for synchronous read mode must tie it to VCCQ or VSS.
F1-OE#
F2-OE#
Input
OUTPUT ENABLE:
Active low input. OE# low enables the device’s output data buffers during read
cycles. OE# high places the data outputs and WAIT in High-Z.
F1-OE# and F2-OE# should be tied together for all densities.
RST#
Input
RESET:
Active low input. RST# resets internal automation and inhibits write operations. This
provides data protection during power transitions. RST# high enables normal operation. Exit from
reset places the device in asynchronous read array mode.
WAIT
Output
WAIT:
Indicates data valid in synchronous array or non-array burst reads. Read Configuration
Register bit 10 (RCR[10], WT) determines its polarity when asserted. WAIT’s active output is V
OL
or
V
OH
when CE# and OE# are V
IL
. WAIT is high-Z if CE# or OE# is V
IH
.
In synchronous array or non-array read modes, WAIT indicates invalid data when asserted and
valid data when deasserted.
In asynchronous page mode, and all write modes, WAIT is deasserted.
WE#
Input
WRITE ENABLE:
Active low input. WE# controls writes to the device. Address and data are latched
on the rising edge of WE#.