PDSP16330/A/B
5
Max.
25
24
PDSP16330A
Min.
12
2
12
0
12
2
5
50
15
15
24
Max.
25
24
25
25
25
25
180
120
Characteristic
*
Input data setup to clock rising edge
Input data Hold after clock rising edge
CEX, CEY Setup to clock rising edge
CEX, CEY Hold aher clock rising edge
FORM, S1:0 Setup to clock rising edge
FORM, S1:0 Hold after clock rising edge
Clock rising edge to valid data
Clock period
Clock high time
Clock low time
Latency
OEM, OEP low to data high data valid
OEM, OEP low to data low data valid
OEM, OEP high to data high impedance
OEM, OEP low to data high impedance
Vcc current (TTL input levels)
Vcc current (CMOS input levels)
SWITCHING CHARACTERISTICS
NOTES
1.
2.
3.
4.
LSTTL is equivalent to I
= 20
μ
A, I
= -0.4mA
Current is defined as negative into the device
CMOS input levels are defined as: V
= V
- 0.5V, V
IL
= +0.5V
All parameters marked * are tested during production.
Parameters marked are guaranteed by design and characterisation.
All timings are dependent on silicon speed. This speed is tested by measuring clock period.
This guarantees all other timings by characterisation and design.
5.
Value
PDSP16330
Min.
15
2
30
0
15
7
5
100
25
25
24
Max.
40
24
30
30
30
30
110
70
PDSP16330B
Min.
12
2
12
0
12
2
5
40
15
15
24
25
25
25
25
225
150
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
cycles
ns
ns
ns
ns
mA
mA
Conditions
2 x LSTTL + 20pF
2 x LSTTL + 20pF
2 x LSTTL + 20pF
2 x LSTTL + 20pF
2 x LSTTL + 20pF
V
= Max
Outputs unloaded
Clock freq. = Max
V
= Max
Outputs unloaded
Clock freq. = Max
ABSOLUTE MAXIMUM RATINGS
Supply voltage, V
cc
Input voltage, V
IN
Output voltage, V
Clamp diode current per pin, I
(see Note 2)
Static discharge voltage (HMB), V
500V
Storage temperature. T
-65
°
C to + 150
°
C
Ambient temperature with
power applied T
amb
:
Commercial
Industrial
Military
Package power dissipation P
1200mW
Junction temperature 150
°
C
-0.5V to + 7.0V
-0.5V to VCC + 0.5V
-0.5V to VCC + 0.5V
±
18mA
0
°
C to + 70
°
C
-40
°
C to + 85
°
C
-55
°
C to + 125
°
C
THERMAL CHARACTERISTICS
Package Type
θ
JC
°
C/W
θ
JA
°
C/W
AC
GC
12
12
36
35
NOTES
1.
Exceeding these ratings may cause permanent damage.
Functional operatlon under these conditions is not implied.
Maximum dissipation or 1 second should not be exceeded;
only one output to be tested at any one time.
Exposure to Absoulte Maximum Ratings for extended periods
may affect device reliability.
2.
3.