參數(shù)資料
型號(hào): PA28F200BL-B150
廠商: INTEL CORP
元件分類: PROM
英文描述: 2-MBIT (128K x 16, 256K x 8)LOW-POWER BOOT BLOCK FLASH MEMORY FAMILY
中文描述: 128K X 16 FLASH 12V PROM, 150 ns, PDSO44
封裝: 1.110 X 0.525 INCH, PLASTIC, SOP-44
文件頁數(shù): 33/48頁
文件大?。?/td> 562K
代理商: PA28F200BL-B150
28F200BX-T/B, 28F002BX-T/B
CAPACITANCE
(1, 2)
T
A
e
25
§
C, f
e
1 MHz
Symbol
Parameter
Typ
Max
Unit
Condition
C
IN
Input Capacitance
6
8
pF
V
IN
e
0V
V
OUT
e
0V
C
OUT
Output Capacitance
10
12
pF
NOTES:
1. Sampled, not 100% tested.
2. For the 28F002BX, address pin A
10
follows the C
OUT
capacitance numbers.
STANDARD TEST CONFIGURATION
(1)
STANDARD AC INPUT/OUTPUT REFERENCE WAVEFORM
290448–14
AC test inputs are driven at V
(2.4 V
) for a Logic ‘‘1’’ and V
OL
(0.45 V
TTL
) for a logic ‘‘0’’. Input timing begins at V
IH
(2.0 V
TTL
) and V
IL
(0.8 V
TTL
). Output timing ends at V
IH
and V
IL
. Input rise and fall times (10%
to 90%)
k
10 ns.
STANDARD AC TESTING
LOAD CIRCUIT
290448–13
C
L
e
100 pF
C
L
Includes Jig Capacitance
R
L
e
3.3 K
X
HIGH SPEED TEST CONFIGURATION
(2)
HIGH SPEED AC INPUT/OUTPUT REFERENCE WAVEFORM
290448–22
AC test inputs are driven at 3.0V for a Logic ‘‘1’’ and 0.0V for a logic ‘‘0’’.
Input timing begins, and output timing ends, at 1.5V. Input rise and fall times
(10% to 90%)
k
10 ns.
NOTES:
1. Testing characteristics for 28F200BX-60/28F002BX-60 in standard test config-
uration and 28F200BX-80/28F002BX-80.
2. Testing characteristics for 28F200BX-60/28F002BX-60 in high speed test con-
figuration.
HIGH SPEED AC TESTING
LOAD CIRCUIT
290448–21
C
L
e
30 pF
C
L
Includes Jig Capacitance
R
L
e
3.3 K
X
33
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