- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄367749 > PA28F008S5-120 (INTEL CORP) BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT PDF資料下載
參數(shù)資料
| 型號： | PA28F008S5-120 |
| 廠商： | INTEL CORP |
| 元件分類： | PROM |
| 英文描述： | BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| 中文描述： | 1M X 8 FLASH 5V PROM, 120 ns, PDSO44 |
| 封裝： | 13.30 X 28.20 MM, PLASTIC, SOP-44 |
| 文件頁數(shù)： | 30/37頁 |
| 文件大小： | 611K |
| 代理商： | PA28F008S5-120 |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁第27頁第28頁第29頁當(dāng)前第30頁第31頁第32頁第33頁第34頁第35頁第36頁第37頁
BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY
E
30
PRODUCT PREVIEW
6.2.4
COMMERCIAL TEMPERATURE AC CHARACTERISTICS - READ-ONLY OPERATIONS
(1)
Commercial Temperature Read-Only Operations for
4-, 8-, and 16-Mbit Smart 5 FlashFile Memories at T
A
= 0°C to +70°C
5V ± 5% V
CC
–85/–95
(5)
Versions
(4)
5V ± 10% V
CC
–90/–100
(6)
–120
(6)
#
Sym
Parameter
Notes Min
Max
Min
Max
Min
Max
Unit
R1
t
AVAV
Read Cycle Time
4, 8 Mbit
85
90
120
ns
16 Mbit
95
100
120
ns
R2
t
AVQV
Address to Output
4, 8 Mbit
85
90
120
ns
Delay
16 Mbit
95
100
120
ns
R3
t
ELQV
CE# to Output Delay
4, 8 Mbit
2
85
90
120
ns
16 Mbit
2
95
100
120
ns
R4
t
GLQV
OE# to Output Delay
2
40
45
50
ns
R5
t
PHQV
RP# High to Output Delay
400
400
400
ns
R6
t
ELQX
CE# to Output in Low Z
3
0
0
0
ns
R7
t
GLQX
OE# to Output in Low Z
3
0
0
0
ns
R8
t
EHQZ
CE# High to Output in High Z
3
55
55
55
ns
R9
t
GHQZ
OE# High to Output in High Z
3
10
10
15
ns
R10
t
OH
Output Hold from Address, CE#
or OE# Change, Whichever
Occurs First
3
0
0
0
ns
NOTES:
1.
2.
3.
4.
5.
See AC Input/Output Reference Waveform for maximum allowable input slew rate.
OE# may be delayed up to t
ELQV
-t
GLQV
after the falling edge of CE# without impact on t
ELQV
.
Sampled, not 100% tested.
See Ordering Information for device speeds (valid operational combinations).
See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (High Speed
Configuration) for testing characteristics.
See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (Standard Configuration)
for testing characteristics.
6.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| PA28F016SC-95 | BYTE-WIDE SmartVoltage FlashFile⑩ MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F004SC-120 | BYTE-WIDE SmartVoltage FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F004SC-85 | BYTE-WIDE SmartVoltage FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F016SC-120 | BYTE-WIDE SmartVoltage FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F200B5B60 | CROSSOVER,RF-RF,DC-6GHZ,50 OHM,SMT |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| PA28F008S5-85 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F008SA-120 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:8-MBIT (1-MBIT x 8) FlashFileTM MEMORY |
| PA28F008SA85 | 制造商:Rochester Electronics LLC 功能描述: 制造商:Intel 功能描述: |
| PA28F008SA-85 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:8-MBIT (1-MBIT x 8) FlashFileTM MEMORY |
| PA28F008SA-L200 | 制造商:未知廠家 制造商全稱:未知廠家 功能描述:x8 Flash EEPROM |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。