- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄367749 > PA28F004SC-120 (INTEL CORP) BYTE-WIDE SmartVoltage FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT PDF資料下載
參數(shù)資料
| 型號： | PA28F004SC-120 |
| 廠商： | INTEL CORP |
| 元件分類： | PROM |
| 英文描述： | BYTE-WIDE SmartVoltage FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| 中文描述： | 512K X 8 FLASH 3.3V PROM, 120 ns, PDSO44 |
| 封裝： | 13.30 X 28.20 MM, PLASTIC, SOP-44 |
| 文件頁數(shù)： | 35/42頁 |
| 文件大?。?/td> | 725K |
| 代理商： | PA28F004SC-120 |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁第27頁第28頁第29頁第30頁第31頁第32頁第33頁第34頁當(dāng)前第35頁第36頁第37頁第38頁第39頁第40頁第41頁第42頁
E
6.5
T
A
= 0°C to +70°C
BYTE-WIDE SmartVoltage FlashFile MEMORY FAMILY
35
PRELIMINARY
AC Characteristics
—Read-Only Operations
(1)
—Commercial Temperature
5 V ± 5% V
CC
-85/-95
(5)
Versions
(4)
5 V ± 10% V
CC
-90/-100
(6)
-120
Unit
3.3 V ± 0.3 V V
CC
-120
-150
2.7 V
3.6 V V
CC
-150
-170
#
Sym
Parameter
Notes Min Max Min Max Min Max Min Max Min Max
85
90
120
95
100
120
85
90
95
100
85
90
95
100
40
45
400
400
R1 t
AVAV
Read Cycle
Time
Address to
Output Delay 16 Mbit
CE# to Output 4, 8 Mbit
Delay
OE# to Output Delay
RP# High to Output
Delay
CE# to Output in Low Z
OE# to Output in Low Z
CE# High to Output in
High Z
OE# High to Output in
High Z
Output Hold from
Address, CE# or OE#
Change, Whichever
Occurs First
4, 8 Mbit
16 Mbit
4, 8 Mbit
150
150
170
170
ns
ns
ns
ns
ns
ns
ns
ns
R2 t
AVQV
120
120
120
120
50
400/
600
(7)
150
150
150
150
55
600
170
170
170
170
55
600
R3 t
ELQV
2
2
2
16 Mbit
R4 t
GLQV
R5 t
PHQV
R6 t
ELQX
R7 t
GLQX
R8 t
EHQZ
3
3
3
0
0
0
0
0
0
0
0
0
0
ns
ns
ns
55
55
55
55
55
R9 t
GHQZ
3
10
10
15
20
25
ns
R10 t
OH
3
0
0
0
0
0
ns
NOTES:
1.
2.
3.
4.
5.
See AC Input/Output Reference Waveform for maximum allowable input slew rate.
OE# may be delayed up to t
ELQV
–t
GLQV
after the falling edge of CE# without impact on t
ELQV
.
Sampled, not 100% tested.
See
Ordering Information
for device speeds (valid operational combinations).
See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (High Speed
Configuration) for testing characteristics.
See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (Standard Configuration)
for testing characteristics.
Valid for 3.3 V V
CC
read operations.
6.
7.
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| PA28F004SC-85 | BYTE-WIDE SmartVoltage FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F016SC-120 | BYTE-WIDE SmartVoltage FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F200B5B60 | CROSSOVER,RF-RF,DC-6GHZ,50 OHM,SMT |
| PA28F400B5B60 | COUPLER, HYBRID, 3DB, 90DEG |
| PA28F800B5T90 | SMART 5 BOOT BLOCK FLASH MEMORY FAMILY 2, 4, 8 MBIT |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| PA28F004SC-85 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SmartVoltage FlashFile⑩ MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F008S3-120 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SMART 3 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F008S3-150 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SMART 3 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F008S5-120 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
| PA28F008S5-85 | 制造商:INTEL 制造商全稱:Intel Corporation 功能描述:BYTE-WIDE SMART 5 FlashFile MEMORY FAMILY 4, 8, AND 16 MBIT |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。