Philips Semiconductors
Product specification
89C51/89C52/89C54/89C58
80C51 8-bit microcontroller family
4K/8K/16K/32K Flash
1999 Oct 27
21
DC ELECTRICAL CHARACTERISTICS
T
amb
= 0
°
C to +70
°
C or –40
°
C to +85
°
C; 5 V
±
10%; V
SS
= 0 V
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
CONDITIONS
MIN
TYP
1
MAX
V
IL
Input low voltage
4.5 V < V
CC
< 5.5 V
–0.5
0.2 V
CC
–0.1
V
V
IH
Input high voltage (ports 0, 1, 2, 3, EA)
0.2 V
CC
+0.9
V
CC
+0.5
V
V
IH1
Input high voltage, XTAL1, RST
0.7 V
CC
V
CC
+0.5
V
V
OL
Output low voltage, ports 1, 2, 3
8
V
CC
= 4.5 V
I
OL
2
0.4
V
V
OL1
Output low voltage, port 0, ALE, PSEN
7, 8
V
CC
= 4.5 V
I
OL
2
0.4
V
V
OH
Output high voltage, ports 1, 2, 3
3
V
CC
= 4.5 V
I
OH
= –30
μ
A
V
CC
– 0.7
V
V
OH1
Output high voltage (port 0 in external bus mode),
ALE
9
, PSEN
3
V
CC
= 4.5 V
I
OH
V
CC
– 0.7
V
I
IL
Logical 0 input current, ports 1, 2, 3
V
IN
= 0.4 V
–1
–75
μ
A
I
TL
Logical 1-to-0 transition current, ports 1, 2, 3
6
V
IN
= 2.0 V
See Note 4
–650
μ
A
I
LI
Input leakage current, port 0
0.45 < V
IN
< V
CC
– 0.3
±
10
μ
A
I
CC
Power supply current (see Figure 21):
Active mode (see Note 5)
Idle mode (see Note 5)
Power-down mode or clock stopped (see Figure 25
for conditions)
See Note 5
T
amb
= 0
°
C to 70
°
C
T
amb
= –40
°
C to +85
°
C
3
100
125
μ
A
μ
A
R
RST
Internal reset pull-down resistor
40
225
k
C
IO
NOTES:
1. Typical ratings are not guaranteed. The values listed are at room temperature, 5 V.
2. Capacitive loading on ports 0 and 2 may cause spurious noise to be superimposed on the V
OL
s of ALE and ports 1 and 3. The noise is due
to external bus capacitance discharging into the port 0 and port 2 pins when these pins make 1-to-0 transitions during bus operations. In the
worst cases (capacitive loading > 100pF), the noise pulse on the ALE pin may exceed 0.8V. In such cases, it may be desirable to qualify
ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input. I
OL
can exceed these conditions provided that no
single output sinks more than 5 mA and no more than two outputs exceed the test conditions.
3. Capacitive loading on ports 0 and 2 may cause the V
OH
on ALE and PSEN to momentarily fall below the V
CC
–0.7 specification when the
address bits are stabilizing.
4. Pins of ports 1, 2 and 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches its
maximum value when V
IN
is approximately 2 V.
5. See Figures 22 through 25 for I
CC
test conditions and Figure 21 for I
CC
vs Freq.
Active mode:
I
CC(MAX)
= (0.9
×
FREQ. + 20)mA
Idle mode:
I
CC(MAX)
= (0.37
×
FREQ. +1.0)mA
6. This value applies to T
°
C to +70
°
C.
7. Load capacitance for port 0, ALE, and PSEN = 100pF, load capacitance for all other outputs = 80 pF.
8. Under steady state (non-transient) conditions, I
must be externally limited as follows:
Maximum I
OL
per port pin:
15 mA (*NOTE: This is 85
°
C specification.)
Maximum I
OL
per 8-bit port:
26 mA
Maximum total I
OL
for all outputs:
71 mA
If I
OL
exceeds the test condition, V
OL
may exceed the related specification. Pins are not guaranteed to sink current greater than the listed
test conditions.
9. ALE is tested to V
OH1
, except when ALE is off then V
OH
is the voltage specification.
10.Pin capacitance is characterized but not tested. Pin capacitance is less than 25 pF. Pin capacitance of ceramic package is less than 15 pF
(except EA is 25 pF).
Pin capacitance
10
(except EA)
15
pF