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Type OPR5001B, OPR5002B, OPR5003B
Elec ri cal Char ac er s ics
(T
A
= 25
o
C un ess oth er wise noted)
SYM BOL
PA RAME TER
MIN
TYP MAX UNITS
TEST CON DI TIONS
NOTES
I
CC
Supply Current
5001
3
7
mA
V
CC
= 24 V
1
5002
6
14
mA
5003
9
20
mA
V
OL
Low Level Output Voltage
0.3
0.4
V
I
OL
= 14 mA, V
CC
= 4.5 V
2
I
OH
High Level Output Current
0.1
1.0
μ
A
V
CC
= V
O
= 20.0 V
3
OPT-HYS
Optical Hysteresis
2.0
15.0
40
%
V
CC
= 5.0 V, I
OL
= 1.0 mA
4, 7
OPT-OFF
Optical Offset
-40
10
+40
%
V
CC
= 5.0 V, I
OL
= 1.0 mA
4, 7
fmax
Frequency Response
300
kHz
V
CC
= 5.0 V
5
tlh
Output Rise Time
2.0
μ
s
6
thl
Output Fall Time
500
ns
Notes:
1. Pin (+) = 1.2
μ
W and Pin (-) = 0.8
μ
W.
2. Pin (+) = 100.0 nW and Pin (-) = 1.0
μ
W.
3. Pin (+) = 1.0
μ
W and Pin (-) 100.0 nW.
4. Pin (-) held at 1.0
μ
W while Pin (+) is ramped from 0.5
μ
W to 1.5
μ
W and back to 0.5
μ
W.
5. Pin (+) modulated from 1.0
μ
W to 2.0
μ
W. Pin (-) modulated from 1.0
μ
W to 2.0
μ
W with phase shifted 180
o
with respect to Pin (+). Use 100
k
trimpot to set the output signal to 50% duty cycle for maximum operating frequency.
6. Measured between 10% and 90% points.
7. Optical Hysteresis and Optical Offset are found by placing 1.0
μ
W of light on the inverting photodiode and ramping the light intensity of the
noninverting input from .5
μ
W up to 1.5
μ
W and back down. This will produce two trigger points, an upper trigger point and lower trigger point.
These points are used to calculate the optical hysteresis and offset.
These are de ined as:
% Optical Hysteresis = 100 x (P rise - P fall)
P in (-)
% Optical Offset
= 100 x (P average - P (-) )
P in (-)
Where:
P in (-) = Light level incident upon the “-” photodiode on the I.C. chip (Pin (-) = 1.0
μ
W).
P rise = Value of light power level incident upon the “+” photodiode that is required to switch the digital output when the light level is an
increasing level (rising edge).
P fall = Value of light power level incident upon the “+” photodiode that is required to switch the digital output when the light level is a
decreasing level (falling edge).
P average
= (P rise + P fall)
Notes:
1. A capacitor of a value between .001 to .01
μ
F connected as close as possible to the trim terminals is recommended
if the device
appears to be susceptable to noise transients
. These capacitors
will
reduce f
max
. It is left to the user to determine the best
value for the application.
2. The 74LS04 is recommended as a means of isolating the “DOC” comparator circuitry from transients induced by inductive and
capacitive loads.
3. It is recommeded that a decoupling capacitor be placed as close as possible to the device.
Ap pli ca ion Cir cuit
Op ek re serves the right to make changes at any time in or der to im prove de sign and to sup ply the best prod uct pos si ble.
Op ek Tech nol ogy, Inc. 1215 W. Crosby Road Car oll on, Texas 75006 (972)323- 2200 Fax (972)323- 2396
9-21
OPR5001B