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參數(shù)資料
| 型號(hào)： | NCN4557MTG |
| 廠商： | ON Semiconductor |
| 文件頁(yè)數(shù)： | 8/12頁(yè) |
| 文件大?。?/td> | 0K |
| 描述： | IC SMART CARD/SIM DUAL 16-QFN |
| 產(chǎn)品變化通告： | Product Discontinuation 30/Sept/2011 |
| 標(biāo)準(zhǔn)包裝： | 123 |
| 系列： | * |
| 應(yīng)用： | * |
| 接口： | * |
| 電源電壓： | * |
| 封裝/外殼： | 16-WFQFN 裸露焊盤 |
| 供應(yīng)商設(shè)備封裝： | 16-QFN（3x3） |
| 包裝： | 管件 |
| 安裝類型： | 表面貼裝 |
NCN4557
http://onsemi.com
5
ATTRIBUTES
Characteristics
Values
ESD protection
Human Body Model (HBM):
Card Pins (1, 4, 5, 6, 7, 14, 15 , 16 & 17) (Note 1)
All Other Pins (Note 1)
Machine Model (MM):
Card Pins (1, 4, 5, 6, 7, 14, 15 , 16 & 17)
All Other Pins
Charged Device Model (CDM):
Card Pins (1, 4, 5, 6, 7, 14, 15 , 16 & 17)
All Other Pins
8 kV
2 kV
600 V
200 V
2 kV
400 V
Moisture sensitivity (Note 2)
QFN16
Level 1
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V0 @ 0.125 in
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. Human Body Model (HBM): R =1500
W, C = 100 pF.
2. For additional information, see Application Note AND8003/D.
MAXIMUM RATINGS
Rating
Symbol
Value
Unit
LDO Power Supply Voltage
VBAT
0.5
≤ VBAT ≤ 6
V
Power Supply Microcontroller Side
VDD
0.5
≤ VDD ≤ 6
V
External Card Power Supply
CRD_VCC
0.5
≤ CRD_VCC ≤ 6
V
Digital Input Pins
Vin
Iin
0.5
≤ Vin ≤ VDD + 0.5
but < 6.0
±5
V
mA
Digital Output Pins
Vout
Iout
0.5
≤ Vout ≤ VDD + 0.5
but < 6.0
± 10
V
mA
CRD Output Pins
CRD_I/O & CRD_RST Pins
CRD_CLK Pin
Vout
Iout
0.5
≤ Vout ≤ CRD_VCC + 0.5
but < 6.0
15 (Internally Limited)
70 (Internally Limited)
V
mA
QFN16 Low Profile package
Power Dissipation @ TA = +85°C
Thermal Resistance JunctiontoAir
PD
RqJA
450
90
mW
°C/W
Operating Ambient Temperature Range
TA
40 to +85
°C
Operating Junction Temperature Range
TJ
40 to +125
°C
Maximum Junction Temperature
TJmax
+125
°C
Storage Temperature Range
Tstg
65 to + 150
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
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