
MOTOROLA
Appendix F. Electrical Characteristics
F-7
ESD Protection
F.4
ESD Protection
Table F-3. ESD Protection
Characteristics
Symbol
Value
Units
ESD for Human Body Model (HBM) 1
1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated
Circuits.
2000
V
HBM Circuit Description
R1
1500
C
100
pF
ESD for Machine Model (MM)
200
V
MM Circuit Description
R1
0
C
200
pF
Number of pulses per pin 2
Positive pulses (MM)
Negative pulses (MM)
Positive pulses (HBM)
Negative pulses (HBM)
2 A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification requirements. Complete DC parametric and functional testing shall be performed per applicable
device specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.
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3
1
—
Interval of Pulses
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1
S